# Effects of metal doping on defect dynamics in graphene:                    <i>In situ</i>                    TEM observation and persistent homology-based structural analysis

https://mdr.nims.go.jp/datasets/e89bc2d2-f4a0-4d08-95e8-58114585bbbc

## File

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## Id

e89bc2d2-f4a0-4d08-95e8-58114585bbbc

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-10-15T01:14:26.633196Z

## Updated at

2026-10-15T04:12:49.053480Z

## Published at

2026-10-15T05:30:43.505672Z

## Doi



## First published url

https://doi.org/10.1063/5.0319808

## Date published

2026-07-13

## Recorded date published

2026-7-13

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: 'Effects of metal doping on defect dynamics in graphene:                    <i>In
    situ</i>                    TEM observation and persistent homology-based structural
    analysis'
  title_type: original
  lang: en

## Description

- description: 'We investigated the dynamic evolution of defects in metal-doped graphene
    and electron-irradiated (non-doped) graphene using in situ transmission electron
    microscopy (operating at 80 kV below the theoretical knock-on threshold) combined
    with persistent homology (PH)-based analysis. PH is quantitative and multiscale
    analytical framework, describing the quantity and scale of k-dimensional holes.
    Here, we applied PH to in situ TEM images in order to quantitatively study the
    effects of metal doping on defect cluster dynamics. In situ observation demonstrated
    that Cr doping induces significantly faster structural dynamics compared to Cu
    doping at the same electron dose rate. Our developed PH-based analysis has been
    extended for application to both undoped and metal-doped graphene, enabling semi-automated
    visualization of the spatial arrangement of N-polygons and quantitative evaluation
    of the connectivity of non-hexagonal rings. The connectivity metric revealed that
    Cr-doped graphene exhibits larger structural fluctuations than electron-irradiated
    graphene, even at similar defect ratios. This finding quantitatively indicates
    that the global defect structure can be tuned by combining Cr-doping with electron
    irradiation. '
  description_type: abstract
  lang: und

## Creator

- name: Ryuto Eguchi
  role: author
  orcid: https://orcid.org/0009-0003-2859-6934
  organization: National Institute for Materials Science
- name: Ayako Hashimoto
  role: author
  orcid: https://orcid.org/0000-0002-1985-7667
  organization: National Institute for Materials Science

## Contact agent



## Publisher

organization: AIP Publishing

## Managing organization



## Keyword

- subject: Data analysis
  schema: not_defined
- subject: Image processing
  schema: not_defined
- subject: Electron radiation effects
  schema: not_defined
- subject: Graphene
  schema: not_defined
- subject: Transmission electron microscopy
  schema: not_defined
- subject: Algebraic topology
  schema: not_defined
- subject: Doping
  schema: not_defined

## Rights

- description: 'This article may be downloaded for personal use only. Any other use
    requires prior permission of the author and AIP Publishing. This article appeared
    in Ryuto Eguchi, Ayako Hashimoto; Effects of metal doping on defect dynamics in
    graphene: In situ TEM observation and persistent homology-based structural analysis.
    Appl. Phys. Lett. 13 July 2026; 129 (2): 021602 and may be found at https://doi.org/10.1063/5.0319808.'
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: APPLIED PHYSICS LETTERS
  issn: '00036951'
  volume: '129'
  issue: '2'
  article_number: '021602'

## Conference



## Related item



## Funding

- identifier: JPMJFR213U
  funder_name: Fusion Oriented REsearch for disruptive Science and Technology
- identifier: JPMJPR17S7
  funder_name: Precursory Research for Embryonic Science and Technology
- identifier: JPMXP1225NM5101
  funder_name: ARIM
- identifier: JPMXP1225NM5102
  funder_name: ARIM

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



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## Fileset

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## Thumbnail

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filename: 26-Eguchi-APL-129-021602-SMandAltText_After2ndReview.pdf