TANUMA, Shigeo
(National Institute for Materials Science
)
;
C.J. Powell
;
D.R. Penn
Description:
(abstract)We report calculations of electron inelastic mean free paths (IMFPs) for 50 eV to 2000 eV electrons in 14 elemental solids (Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, and Dy) and for one solid (Al) using better optical data than in our previous work. The new IMFPs have also been used to test our TPP-2M equation for estimating IMFPs in these materials. We found surprisingly large root-mean-square deviations (from 39.3 % to 71.8 %) between IMFPs calculated from TPP-2M and those calculated here from optical data for diamond, graphite, and cesium. An analysis showed that these deviations occurred for relatively small computed values of the parameter beta in the TPP-2M equation (beta ~ 0.01 for diamond and graphite) and for a relatively large value of beta (beta ~ 0.25 for Cs). While such extreme values of beta are unlikely to be encountered for many other materials, the present results indicate an aditional limitation in the reliability of the TPP-2M equation. We also show that the parameter Nv in the TPP-2M equation should be computed for the rare-earth elements from the number of valence electrons and the six 5p electrons.
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Keyword: IMFP, electron inelastic mean free path, Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, Dy, Al, TPP-2M equation, rare-earth elements
Date published: 2005-01-10
Publisher: Wiley
Journal:
Funding:
Manuscript type: Author's version (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.3964
First published URL: https://doi.org/10.1002/sia.1997
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Updated at: 2024-01-05 22:13:47 +0900
Published on MDR: 2023-05-17 11:43:20 +0900
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