# XAFS spectrum of Silicon carbide

https://mdr.nims.go.jp/datasets/e19f927d-3bb7-43ec-b308-e3a2773650af

## File

- [SiC.dat](https://mdr.nims.go.jp/filesets/48a365e3-97fe-47c2-b3f6-ffa38267617f/download) ([Detail](https://mdr.nims.go.jp/filesets/48a365e3-97fe-47c2-b3f6-ffa38267617f.md))
- [SiC.pfy](https://mdr.nims.go.jp/filesets/43794a08-5f81-40a5-ba19-14293e2ffb05/download) ([Detail](https://mdr.nims.go.jp/filesets/43794a08-5f81-40a5-ba19-14293e2ffb05.md))
- [SiC.tey](https://mdr.nims.go.jp/filesets/f63abd50-f3f3-48ab-81bf-46f3163195ca/download) ([Detail](https://mdr.nims.go.jp/filesets/f63abd50-f3f3-48ab-81bf-46f3163195ca.md))
- [metadata.json](https://mdr.nims.go.jp/filesets/c1e1883c-f072-42e8-a00d-717c6335fef2/download) ([Detail](https://mdr.nims.go.jp/filesets/c1e1883c-f072-42e8-a00d-717c6335fef2.md))
- [metadata.yml](https://mdr.nims.go.jp/filesets/8bbaf688-7ac3-428c-abf6-49a2394c18e9/download) ([Detail](https://mdr.nims.go.jp/filesets/8bbaf688-7ac3-428c-abf6-49a2394c18e9.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/e2e57157-29bc-40fd-9700-d3bb61ac4df7/download) ([Detail](https://mdr.nims.go.jp/filesets/e2e57157-29bc-40fd-9700-d3bb61ac4df7.md))
- [BL10_Si-K_006_pfy.png](https://mdr.nims.go.jp/filesets/f210df29-aaa1-4c6b-bada-43c3e15e2d0b/download) ([Detail](https://mdr.nims.go.jp/filesets/f210df29-aaa1-4c6b-bada-43c3e15e2d0b.md))
- [BL10_Si-K_006_tey.png](https://mdr.nims.go.jp/filesets/21f4ef35-af5c-4701-8659-e5fcc98428ff/download) ([Detail](https://mdr.nims.go.jp/filesets/21f4ef35-af5c-4701-8659-e5fcc98428ff.md))

## Id

e19f927d-3bb7-43ec-b308-e3a2773650af

## Local identifier

identifier: Ritsu_MDR_20220603/mdr-bp0004-0000047

## Visibility

open_to_public

## State

published

## Created at

2022-03-28T11:22:26.122242Z

## Updated at

2025-05-02T13:03:46.858507Z

## Published at

2022-06-10T13:40:04.548779Z

## Doi

https://doi.org/10.48505/nims.3329

## First published url

https://www.ritsumei.ac.jp/acd/re/src/sx_xafs_db/

## Date published



## Recorded date published



## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Silicon carbide
  title_type: original
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Si K-edge of Silicon carbide measured at Ritsumeikan-SR BL-10, and is a part
    of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Ritsumeikan SR Center
  role: author
  organization: Ritsumeikan University
  ror: https://ror.org/0197nmd03

## Contact agent

- name: Ritsumeikan SR Center
  organization: Ritsumeikan University

## Publisher

organization: Ritsumeikan University

## Managing organization



## Keyword

- subject: Silicon carbide
  schema: not_defined
- subject: SiC
  schema: not_defined
- subject: Si K-edge
  schema: not_defined
- subject: Carbide
  schema: not_defined
- subject: BL-10
  schema: not_defined
- subject: Ritsumeikan-SR
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: collection - MDR XAFS DB
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin

- data_origin_type: experiment

## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL-10_XAFS
  description: Ritsumeikan SR Center Soft X-ray XAFS Beamline setup
  manufacturer: Ritsumeikan SR Center
  function_description: x-ray absorption spectroscopy

## Instrument operator



## Instrument managing organization

- organization: Ritsumeikan University
  department: Ritsumeikan SR Center
  ror: '0197nmd03'

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: TEY
  measured_at: '2016-03-30T05:08:07Z'
- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: PFY
  measured_at: '2016-03-30T05:08:07Z'

## Specimen

- name: Silicon carbide
  description: powder, on carbon tape
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q722
  material_type_description: Carbide

## Chemical composition

- identifier: 409-21-2
  category_vocabulary: http://matvoc.nims.go.jp/entity/Q2368

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2501
  description: Si K-edge

## Software



## Custom property



## Fileset

- id: 48a365e3-97fe-47c2-b3f6-ffa38267617f
  filename: SiC.dat
  content_type: application/octet-stream
  size: 32973
  md5: fea57045d95a61d5c053a1d428fa3183
- id: 43794a08-5f81-40a5-ba19-14293e2ffb05
  filename: SiC.pfy
  content_type: application/octet-stream
  size: 5285
  md5: b0d3c35af2fcd86bcb7c56ca3c0b8212
- id: f63abd50-f3f3-48ab-81bf-46f3163195ca
  filename: SiC.tey
  content_type: application/octet-stream
  size: 5361
  md5: 0de88a7ccd00b1d0c13ff80fbdd7c524
- id: c1e1883c-f072-42e8-a00d-717c6335fef2
  filename: metadata.json
  content_type: application/json
  size: 15509
  md5: 2f502b3d1d4261972e7e36e446e0c31a
- id: 8bbaf688-7ac3-428c-abf6-49a2394c18e9
  filename: metadata.yml
  content_type: application/octet-stream
  size: 8081
  md5: 2b4234c73ed0867e3d20e4f585144fe6
- id: e2e57157-29bc-40fd-9700-d3bb61ac4df7
  filename: primary.tsv
  content_type: text/tab-separated-values
  size: 14550
  md5: ea51cd2f96bba2f8c079af0bc7b30407
- id: f210df29-aaa1-4c6b-bada-43c3e15e2d0b
  filename: BL10_Si-K_006_pfy.png
  content_type: image/png
  size: 20658
  md5: 42476815a7cbe947561eeb2d3e960f64
- id: 21f4ef35-af5c-4701-8659-e5fcc98428ff
  filename: BL10_Si-K_006_tey.png
  content_type: image/png
  size: 21970
  md5: 50a93ea1290e3f042a8901f57e0fdd4f

## Thumbnail

fileset_id: 21f4ef35-af5c-4701-8659-e5fcc98428ff
filename: BL10_Si-K_006_tey.png