Ryuto Eguchi
(National Institute for Materials Science
)
;
Yu Wen
(National Institute for Materials Science
)
;
Hideki Abe
(National Institute for Materials Science
)
;
Ayako Hashimoto
(National Institute for Materials Science
)
説明:
(abstract)Persistent homology is a powerful tool for quantifying various structures, but it is equally crucial to maintain its interpretability. In this study, we extracted interpretable geometric features from the persistent diagrams (PDs) of scanning transmission electron microscopy (STEM) images of self-assembled Pt-CeO2 nanostructures synthesized under different annealing conditions. We focused on PD quadrants and extracted five interpretable features from the zeroth and first PDs of nanostructures ranging from maze-like to striped patterns. A combination of hierarchical clus-tering and inverse analysis of PDs reconstructed by principal component analysis through vec-torization of the PDs highlighted the importance of the number of arc-like structures of the CeO2 phase in the first PDs, particularly those that were smaller than a characteristic size. This descriptor enabled us to quantify the degree of disorder, namely the density of bends, in nanostructures formed under different conditions. By using this descriptor along with the width of the CeO2 phase, we classified 12 Pt-CeO2 nanostructures in an interpretable way.
権利情報:
キーワード: persistent homology, metal-oxide nanostructures, scanning transmission electron microscopy (STEM)
刊行年月日: 2024-08-29
出版者: MDPI AG
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.3390/nano14171413
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-10-09 08:30:46 +0900
MDRでの公開時刻: 2024-10-09 08:30:46 +0900
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nanomaterials-14-01413.pdf
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サイズ | 2.62MB | 詳細 |