# Direct Visualization of Defect‐Controlled Diffusion in van der Waals Gaps

https://mdr.nims.go.jp/datasets/d5cde818-255d-43a4-99f5-2cf7e2b58a27

## File

- [Advanced Materials - 2024 - Thomsen - Direct Visualization of Defect‐Controlled Diffusion in van der Waals Gaps.pdf](https://mdr.nims.go.jp/filesets/e674a37c-2f21-4c79-b9e8-df034c0c8642/download) ([Detail](https://mdr.nims.go.jp/filesets/e674a37c-2f21-4c79-b9e8-df034c0c8642.md))

## Id

d5cde818-255d-43a4-99f5-2cf7e2b58a27

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-02-07T10:12:55.033462Z

## Updated at

2026-02-14T13:51:07.187541Z

## Published at

2026-02-10T09:03:06.991772Z

## Doi



## First published url

https://doi.org/10.1002/adma.202403989

## Date published

2024-08-04

## Recorded date published

2024-9

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Direct Visualization of Defect‐Controlled Diffusion in van der Waals Gaps
  title_type: original
  lang: en

## Description

- description: Diffusion processes govern fundamental phenomena such as phase transformations,
    doping, and intercalation in van der Waals (vdW) bonded materials. Here, we quantify
    the diffusion dynamics of W atoms by visualizing the motion of individual atoms
    at three different vdW interfaces, BN/vacuum, BN/BN, and BN/WS2, using scanning
    transmission electron microscopy movies. Supported by density functional theory
    calculations, we infer that in all cases diffusion is governed by intermittent
    trapping at electron beam-generated defect sites. This leads to diffusion properties
    that depend strongly on the number of defects. These results suggest that diffusion
    and intercalation processes in vdW materials are highly tunable and sensitive
    to crystal quality. Furthermore, the demonstration of atomic resolution imaging
    of materials inside vdW heterostructures offers possibilities for direct visualization
    of diffusion and atomic interactions, as well as for experiments exploring atomic
    structures, their in-situ modification, and electrical property measurement.
  description_type: abstract
  lang: und

## Creator

- name: Joachim Dahl Thomsen
  role: author
- name: Yaxian Wang
  role: author
- name: Henrik Flyvbjerg
  role: author
- name: Eugene Park
  role: author
- name: Kenji Watanabe
  role: author
  orcid: https://orcid.org/0000-0003-3701-8119
  organization: National Institute for Materials Science
- name: Takashi Taniguchi
  role: author
  orcid: https://orcid.org/0000-0002-1467-3105
  organization: National Institute for Materials Science
- name: Prineha Narang
  role: author
- name: Frances M. Ross
  role: author

## Contact agent



## Publisher

organization: Wiley

## Managing organization



## Keyword

- subject: Defect-Controlled atomic Diffusion
  schema: not_defined
- subject: van der Waals (vdW) gaps
  schema: not_defined
- subject: scanning transmission electron microscopy
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2024-08-04

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Advanced Materials
  issn: '09359648'
  volume: '36'
  issue: '39'
  article_number: '2403989'

## Conference



## Related item



## Funding

- identifier: FWP ERKCK47
  funder_name: Basic Energy Sciences
- identifier: W911NF‐18‐1‐0431
  funder_name: Army Research Office
- identifier: GBMF8048
  funder_name: Gordon and Betty Moore Foundation

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



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## Fileset

- id: e674a37c-2f21-4c79-b9e8-df034c0c8642
  filename: Advanced Materials - 2024 - Thomsen - Direct Visualization of Defect‐Controlled
    Diffusion in van der Waals Gaps.pdf
  content_type: application/pdf
  size: 9991281
  md5: 606f0e90599cfae55f7e82fa0a3d3ee6

## Thumbnail

fileset_id: e674a37c-2f21-4c79-b9e8-df034c0c8642
filename: Advanced Materials - 2024 - Thomsen - Direct Visualization of Defect‐Controlled
  Diffusion in van der Waals Gaps.pdf