# Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection

https://mdr.nims.go.jp/datasets/d5976893-5243-4414-ab7c-e0f87e0deff5

## File

- [Ueda_PRB2024.pdf](https://mdr.nims.go.jp/filesets/b8610c8b-d52e-471a-b6d2-3400ae881d09/download) ([Detail](https://mdr.nims.go.jp/filesets/b8610c8b-d52e-471a-b6d2-3400ae881d09.md))

## Id

d5976893-5243-4414-ab7c-e0f87e0deff5

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-02-08T08:01:04.464811Z

## Updated at

2024-02-13T00:11:36.746368Z

## Published at

2024-02-13T03:30:14.652884Z

## Doi



## First published url

https://doi.org/10.1103/PhysRevB.109.085109

## Date published

2024-02-07

## Recorded date published

2024-2

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Near-interface electronic and magnetic states of insulator/Co2MnSi structures
    probed by hard x-ray photoemission combined with x-ray total reflection
  title_type: original
  lang: en

## Description

- description: Depth-dependent electronic and magnetic states of AlOx and MgO capped
    Co2MnSi thin films were measured by using hard X-ray photoemission spectroscopy
    (HAXPES) combined with X-ray total reflection (TR).  TR-HAXPES revealed that the
    near-interface electronic and magnetic states of Co2MnSi films differed from those
    of bulk measured in non-TR condition.  The decrease of the Co and Mn magnetizations
    near the interface along the easy magnetization axis in the bulk region relative
    to those in the bulk region and the changes in the valence band profiles were
    experimentally detected by non-destructive HAXPES utilizing TR. These results
    suggest that the combination of HAXPES with TR is useful to experimentally detect
    the electronic and magnetic states of near-interface and buried bulk regions in
    non-destructive way for insulator/ferromagnet heterojunctions.
  description_type: abstract
  lang: eng

## Creator

- name: Shigenori Ueda
  role: author
  orcid: https://orcid.org/0000-0001-9425-0614
  organization: National Institute for Materials Science
  department: Research Center for Electronic and Optical Materials/Functional Materials
    Field/Electro-ceramics Group
  ror: https://ror.org/026v1ze26
- name: Yuichi Fujita
  role: author
  orcid: https://orcid.org/0000-0002-1798-1066
  organization: National Institute for Materials Science
  department: Global Networking Division/International Center for Young Scientists
  ror: https://ror.org/026v1ze26
- name: Yuya Sakuraba
  role: author
  orcid: https://orcid.org/0000-0003-4618-9550
  organization: National Institute for Materials Science
  department: Research Center for Magnetic and Spintronic Materials/Magnetic Functional
    Device Group
  ror: https://ror.org/026v1ze26

## Contact agent



## Publisher

organization: APS

## Managing organization



## Keyword

- subject: insulator/Co2MnSi heterostructures
  schema: not_defined
- subject: interface and bulk electronic and magnetic states
  schema: not_defined
- subject: HAXPES
  schema: not_defined
- subject: X-ray total reflection
  schema: not_defined
- subject: SX-ARPES
  schema: not_defined

## Rights

- description: Published by the American Physical Society under the terms of the Creative
    Commons Attribution 4.0 International license. Further distribution of this work
    must maintain attribution to the author(s) and the published article’s title,
    journal citation, and DOI.
  identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: PHYSICAL REVIEW B
  issn: '24699969'
  volume: '109'
  issue: '8'
  article_number: '085109'

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## Fileset

- id: b8610c8b-d52e-471a-b6d2-3400ae881d09
  filename: Ueda_PRB2024.pdf
  content_type: application/pdf
  size: 1539019
  md5: 3fce8bf4b81d49ff269a6e8c05aa96b7

## Thumbnail

fileset_id: b8610c8b-d52e-471a-b6d2-3400ae881d09
filename: Ueda_PRB2024.pdf