Zhendong Wu
;
Tetsuya Tohei
;
Yusuke Hayashi
;
Shigeyoshi Usami
;
Masayuki Imanishi
;
Yusuke Mori
;
Junichi Takino
;
Kazushi Sumitani
;
Yasuhiko Imai
;
Shigeru Kimura
;
Akira Sakai
説明:
(abstract)Nanobeam X-ray diffraction (nanoXRD) enables nanoscale mapping of crystal structures across wafer-scale crystals, offering unique insight into microstructural evolution during crystal growth. However, the resulting large and complex diffraction datasets make it challenging to quantitatively resolve local structural transitions and their connection to growth processes using conventional analysis. Here, we present a continuity-driven, unsupervised, and generalized analysis framework, referred to as the neighborhood-based similarity metric, which integrates spatial coordinates with nanoXRD data to reveal structural variations across growth sectors, interfaces, and defect-related regions without requiring prior knowledge or labels. By introducing Jaccard similarity scores to compare local neighborhoods in spatial and diffraction domains, the method quantitatively detects discontinuities where structural evolution disrupts the local continuity of diffraction patterns. Our unsupervised approach, validated with synthetic data and nanoXRD measurements of bulk GaN crystals, successfully identified both known defects and previously hidden structural discontinuities. The results provide new insights into the relationship between growth conditions, local strain evolution, and defect formation, establishing a robust and interpretable approach for linking processing and structural characteristics in complex crystalline materials.
権利情報:
刊行年月日: 2026-02-15
出版者: Elsevier BV
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1016/j.matdes.2026.115669
関連資料:
その他の識別子:
連絡先:
更新時刻: 2026-02-26 12:30:06 +0900
MDRでの公開時刻: 2026-02-26 09:41:08 +0900
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Wu Mater Design 2026 nanoXRD ML.pdf
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