@misc{ralfy2023a,
  title = {Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry},
  author = {Ralfy Kenaz, Saptarshi Ghosh, Pradheesh Ramachandran, Kenji Watanabe, Takashi Taniguchi, Hadar Steinberg, Ronen Rapaport},
  publisher = {American Chemical Society (ACS)},
  year = {2023-05-23},
  keywords = {Spectroscopic ellipsometry, thickness mapping, transition metal dichalcogenides}
}