# International Standardization of Terminology, Sample Handling and Data Transfer Format for Scanning Probe Microscopy

https://mdr.nims.go.jp/datasets/cd8e77ec-d42c-4ae7-932c-25d1a7b0fd5e

## File

- [SPM_terminology_and_data_format_r2.doc](https://mdr.nims.go.jp/filesets/ccc137fe-7507-4f71-9d22-489e6579f965/download) ([Detail](https://mdr.nims.go.jp/filesets/ccc137fe-7507-4f71-9d22-489e6579f965.md))

## Id

cd8e77ec-d42c-4ae7-932c-25d1a7b0fd5e

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-04-02T07:55:51.736973Z

## Updated at

2025-04-02T23:30:13.113654Z

## Published at

2025-04-03T05:10:58.792922Z

## Doi

https://doi.org/10.48505/nims.5402

## First published url

https://doi.org/10.1380/vss.68.26

## Date published

2025-01-10

## Recorded date published

2025

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: International Standardization of Terminology, Sample Handling and Data Transfer
    Format for Scanning Probe Microscopy
  title_type: original
  lang: en

## Description

- description: 特集号「ナノプローブ国際標準化の現状とその将来展望」の特集記事として、走査型プローブ顕微鏡分野における用語，試料の取扱い及びデータ転送フォーマットに関する国際標準化の現状とその将来展望について解説する。
  description_type: abstract
  lang: und

## Creator

- name: Keiko ONISHI
  role: author
  orcid: https://orcid.org/0000-0003-3979-8905

## Contact agent



## Publisher

organization: Surface Science Society Japan

## Managing organization



## Keyword

- subject: scanning probe microscopy
  schema: not_defined
- subject: international standardization
  schema: not_defined
- subject: terminology
  schema: not_defined
- subject: sample handling
  schema: not_defined
- subject: data management
  schema: not_defined

## Rights

- description: "©公益社団法人 日本表面真空学会"
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Vacuum and Surface Science
  issn: '24335835'
  volume: '68'
  issue: '1'
  start_page: 26
  end_page: 30
  article_number: '20181402'

## Conference



## Related item



## Funding



## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: ccc137fe-7507-4f71-9d22-489e6579f965
  filename: SPM_terminology_and_data_format_r2.doc
  content_type: application/msword
  size: 331264
  md5: 956ac9fe3a0a97cfedeba81683afb239

## Thumbnail

fileset_id: ccc137fe-7507-4f71-9d22-489e6579f965
filename: SPM_terminology_and_data_format_r2.doc