# An extraordinarily low-energy threshold of less than 60 keV for ion track formation in silicon

https://mdr.nims.go.jp/datasets/c82821bb-0806-4e9c-add0-880031b5480b

## File

- [Materialia_2025.pdf](https://mdr.nims.go.jp/filesets/90899071-9792-46ab-a04a-5bd9fef09654/download) ([Detail](https://mdr.nims.go.jp/filesets/90899071-9792-46ab-a04a-5bd9fef09654.md))

## Id

c82821bb-0806-4e9c-add0-880031b5480b

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-01-20T06:22:34.661648Z

## Updated at

2025-01-21T03:30:27.893308Z

## Published at

2025-01-21T03:30:28.078446Z

## Doi



## First published url

https://doi.org/10.1016/j.mtla.2024.102317

## Date published

2024-12-09

## Recorded date published

2025-3

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: An extraordinarily low-energy threshold of less than 60 keV for ion track
    formation in silicon
  title_type: original
  lang: en

## Description

- description: 'We investigated track formation under an irradiation of less than
    1 MeV: (i) With a decrease in energy, the diameters and lengths of the tracks
    decreased; however, the length decreased more steeply than the diameter. (ii)
    Although the tracks were fuzzily perceived down to 60-keV irradiation, no tracks
    were observed under 30-keV irradiation, except for an extended damage zone. Furthermore,
    we observed (iii) track formation below the electronic stopping threshold, and
    (iv) track length extension due to the “clearing-the-way” effect at low energies.
    (v) Finally, the approximated linearity between the track volume and C60 energy
    is discussed. '
  description_type: abstract
  lang: und

## Creator

- name: H.  Amekura
  role: author
  orcid: https://orcid.org/0000-0003-2148-8431
  organization: NIMS
  department: エネルギー・環境材料研究センター
- name: K. Narumi
  role: author
  organization: QST
- name: A. Chiba
  role: author
  organization: QST
- name: Y. Hirano
  role: author
  organization: QST
- name: K. Yamada
  role: author
  organization: QST
- name: S. Yamamoto
  role: author
  organization: QST
- name: Y. Saitoh
  role: author
  organization: QST

## Contact agent



## Publisher

organization: Elsevier BV

## Managing organization



## Keyword

- subject: ion track
  schema: not_defined
- subject: C60 ion
  schema: not_defined
- subject: silicon
  schema: not_defined
- subject: cluster effect
  schema: not_defined
- subject: swift heavy ion
  schema: not_defined

## Rights

- description: "This is an open access article under the CC BY license\r\n( http://creativecommons.org/licenses/by/4.0/
    )."
  identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Materialia
  issn: '25891529'
  volume: '39'
  article_number: '102317'

## Conference



## Related item



## Funding

- identifier: 22K04990
  funder_name: JSPS

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 90899071-9792-46ab-a04a-5bd9fef09654
  filename: Materialia_2025.pdf
  content_type: application/pdf
  size: 4907993
  md5: 70f98eb9e723dd01bae15c4bef15369f

## Thumbnail

fileset_id: 90899071-9792-46ab-a04a-5bd9fef09654
filename: Materialia_2025.pdf