# XAFS spectrum of Silicon dioxide (Quartz) https://mdr.nims.go.jp/datasets/c665369d-28b1-4c1d-9198-00f61555fe34 ## File - [20052209.tey](https://mdr.nims.go.jp/filesets/59fe52b8-8bae-4166-90a7-db5f403cc6d7/download) ([Detail](https://mdr.nims.go.jp/filesets/59fe52b8-8bae-4166-90a7-db5f403cc6d7.md)) - [metadata.json](https://mdr.nims.go.jp/filesets/f3118bcb-4d3e-4bfa-975a-07e1ff8e3135/download) ([Detail](https://mdr.nims.go.jp/filesets/f3118bcb-4d3e-4bfa-975a-07e1ff8e3135.md)) - [metadata.yml](https://mdr.nims.go.jp/filesets/b39fc325-475d-4fd4-90a8-7324d2dda31d/download) ([Detail](https://mdr.nims.go.jp/filesets/b39fc325-475d-4fd4-90a8-7324d2dda31d.md)) - [primary.tsv](https://mdr.nims.go.jp/filesets/d6b6a732-4885-4de9-a0c4-f043aa541f6e/download) ([Detail](https://mdr.nims.go.jp/filesets/d6b6a732-4885-4de9-a0c4-f043aa541f6e.md)) - [20052209.dat](https://mdr.nims.go.jp/filesets/b74c89d6-fff6-46f4-ac95-cf9bccf6b02c/download) ([Detail](https://mdr.nims.go.jp/filesets/b74c89d6-fff6-46f4-ac95-cf9bccf6b02c.md)) - [BL13_Si-K_001_tey.png](https://mdr.nims.go.jp/filesets/2f7d3e48-f963-4a4b-a8a7-2116eab69ff7/download) ([Detail](https://mdr.nims.go.jp/filesets/2f7d3e48-f963-4a4b-a8a7-2116eab69ff7.md)) ## Id c665369d-28b1-4c1d-9198-00f61555fe34 ## Local identifier identifier: Ritsu_MDR_20220603/mdr-bp0004-0000068 ## Visibility open_to_public ## State published ## Created at 2022-03-28T11:22:35.145379Z ## Updated at 2025-05-02T13:00:09.137705Z ## Published at 2022-06-10T13:38:18.672437Z ## Doi https://doi.org/10.48505/nims.3350 ## First published url https://www.ritsumei.ac.jp/acd/re/src/sx_xafs_db/ ## Date published ## Recorded date published ## Resource type dataset ## Manuscript type na ## Collection - id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54 identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54 title: MDR XAFS DB ## Title - title: XAFS spectrum of Silicon dioxide (Quartz) title_type: original lang: en ## Description - description: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon dioxide (Quartz) measured at Ritsumeikan-SR BL-13, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR description_type: abstract lang: en ## Creator - name: Masashi Ishii role: editor orcid: https://orcid.org/0000-0003-0357-2832 organization: National Institute for Materials Science - name: Ritsumeikan SR Center role: author organization: Ritsumeikan University ror: https://ror.org/0197nmd03 ## Contact agent - name: Ritsumeikan SR Center organization: Ritsumeikan University ## Publisher organization: Ritsumeikan University ## Managing organization ## Keyword - subject: Quartz schema: not_defined - subject: SiO2(quartz) schema: not_defined - subject: Si K-edge schema: not_defined - subject: Oxide schema: not_defined - subject: BL-13 schema: not_defined - subject: Ritsumeikan-SR schema: not_defined - subject: XAFS schema: not_defined - subject: collection - MDR XAFS DB schema: not_defined - subject: Silicon dioxide (Quartz) schema: not_defined ## Rights - description: Creative Commons BY Attribution 4.0 International identifier: https://creativecommons.org/licenses/by/4.0/ date_licensed: 2025-05-01 ## Other identifier(s) ## Data origin - data_origin_type: experiment ## Embargo ## Journal ## Conference ## Related item ## Funding ## Instrument - name: BL-13_XAFS description: Ritsumeikan SR Center Soft X-ray XAFS Beamline setup manufacturer: Ritsumeikan SR Center function_description: x-ray absorption spectroscopy ## Instrument operator ## Instrument managing organization - organization: Ritsumeikan University department: Ritsumeikan SR Center ror: '0197nmd03' ## Measurement method - category_vocabulary: http://matvoc.nims.go.jp/entity/Q386 category_description: x-ray absorption spectroscopy analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30 analysis_field_description: spectroscopy description: TEY measured_at: '2020-05-22T08:46:00Z' ## Specimen - name: Silicon dioxide (Quartz) description: powder, on carbon tape material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q735 material_type_description: Oxide ## Chemical composition - category_vocabulary: http://matvoc.nims.go.jp/entity/Q2365 ## Structure for specimen ## Structural feature for specimen - category_vocabulary: http://matvoc.nims.go.jp/entity/Q686 category_description: local structure description: Geometrical and electronic local structure around the absorption element ## Specific property for specimen ## Process for specimen treatment ## Computational method ## Energy level/transition state - category_vocabulary: http://matvoc.nims.go.jp/entity/Q2501 description: Si K-edge ## Software ## Custom property ## Fileset - id: 59fe52b8-8bae-4166-90a7-db5f403cc6d7 filename: 20052209.tey content_type: application/octet-stream size: 5816 md5: 65515ac0f23594a0b5de7df4e97e980d - id: f3118bcb-4d3e-4bfa-975a-07e1ff8e3135 filename: metadata.json content_type: application/json size: 12896 md5: 3078f9287d929f19bd0ff0b2ce44233f - id: b39fc325-475d-4fd4-90a8-7324d2dda31d filename: metadata.yml content_type: application/octet-stream size: 6548 md5: a70abe5dde0b2625a19fe6e671abf855 - id: d6b6a732-4885-4de9-a0c4-f043aa541f6e filename: primary.tsv content_type: text/tab-separated-values size: 11817 md5: 0ef4092d5b5ea0045334f6b4dfeecdce - id: b74c89d6-fff6-46f4-ac95-cf9bccf6b02c filename: 20052209.dat content_type: application/octet-stream size: 50881 md5: 1d6b52826e57f9ccac660a6fb0b299fe - id: 2f7d3e48-f963-4a4b-a8a7-2116eab69ff7 filename: BL13_Si-K_001_tey.png content_type: image/png size: 18738 md5: 7edafad6b882a9d3300146bd5bbf3057 ## Thumbnail fileset_id: 2f7d3e48-f963-4a4b-a8a7-2116eab69ff7 filename: BL13_Si-K_001_tey.png