# XAFS spectrum of Silicon dioxide (amorphous)

https://mdr.nims.go.jp/datasets/c08a480f-e900-4c4f-b9e8-48154a8219ff

## File

- [17032302.dat](https://mdr.nims.go.jp/filesets/36aa1461-881a-4695-b737-6df50b9e07a7/download) ([Detail](https://mdr.nims.go.jp/filesets/36aa1461-881a-4695-b737-6df50b9e07a7.md))
- [17032302.pfy](https://mdr.nims.go.jp/filesets/3a0fc639-4f4f-4be8-b82e-f29a8a133d13/download) ([Detail](https://mdr.nims.go.jp/filesets/3a0fc639-4f4f-4be8-b82e-f29a8a133d13.md))
- [17032302.tey](https://mdr.nims.go.jp/filesets/0a96adca-f03e-476b-9053-2c6b963c0c1c/download) ([Detail](https://mdr.nims.go.jp/filesets/0a96adca-f03e-476b-9053-2c6b963c0c1c.md))
- [metadata.json](https://mdr.nims.go.jp/filesets/f8c57fa7-42e6-4114-b251-b6fd49a8aea8/download) ([Detail](https://mdr.nims.go.jp/filesets/f8c57fa7-42e6-4114-b251-b6fd49a8aea8.md))
- [metadata.yml](https://mdr.nims.go.jp/filesets/d2200c9a-018a-40ce-a47d-e0f5ac622cc2/download) ([Detail](https://mdr.nims.go.jp/filesets/d2200c9a-018a-40ce-a47d-e0f5ac622cc2.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/0cb73a73-751a-4d4f-bd36-24e19d73e22b/download) ([Detail](https://mdr.nims.go.jp/filesets/0cb73a73-751a-4d4f-bd36-24e19d73e22b.md))
- [BL10_Si-K_004_pfy.png](https://mdr.nims.go.jp/filesets/b32aa48d-c5c6-4d2d-8c6e-713971f3ec9a/download) ([Detail](https://mdr.nims.go.jp/filesets/b32aa48d-c5c6-4d2d-8c6e-713971f3ec9a.md))
- [BL10_Si-K_004_tey.png](https://mdr.nims.go.jp/filesets/6ea68ae1-dee1-4b21-88a0-2e5489c3937e/download) ([Detail](https://mdr.nims.go.jp/filesets/6ea68ae1-dee1-4b21-88a0-2e5489c3937e.md))

## Id

c08a480f-e900-4c4f-b9e8-48154a8219ff

## Local identifier

identifier: Ritsu_MDR_20220603/mdr-bp0004-0000046

## Visibility

open_to_public

## State

published

## Created at

2022-03-28T11:22:25.671507Z

## Updated at

2025-05-02T12:59:25.939367Z

## Published at

2022-06-10T13:40:08.953803Z

## Doi

https://doi.org/10.48505/nims.3328

## First published url

https://www.ritsumei.ac.jp/acd/re/src/sx_xafs_db/

## Date published



## Recorded date published



## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Silicon dioxide (amorphous)
  title_type: original
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Si K-edge of Silicon dioxide (amorphous) measured at Ritsumeikan-SR BL-10,
    and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447)
    as a collection of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Ritsumeikan SR Center
  role: author
  organization: Ritsumeikan University
  ror: https://ror.org/0197nmd03

## Contact agent

- name: Ritsumeikan SR Center
  organization: Ritsumeikan University

## Publisher

organization: Ritsumeikan University

## Managing organization



## Keyword

- subject: Silicon dioxide (amorphous)
  schema: not_defined
- subject: SiO2(amorphous)
  schema: not_defined
- subject: Si K-edge
  schema: not_defined
- subject: Oxide
  schema: not_defined
- subject: BL-10
  schema: not_defined
- subject: Ritsumeikan-SR
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: collection - MDR XAFS DB
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin

- data_origin_type: experiment

## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL-10_XAFS
  description: Ritsumeikan SR Center Soft X-ray XAFS Beamline setup
  manufacturer: Ritsumeikan SR Center
  function_description: x-ray absorption spectroscopy

## Instrument operator



## Instrument managing organization

- organization: Ritsumeikan University
  department: Ritsumeikan SR Center
  ror: '0197nmd03'

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: TEY
  measured_at: '2017-03-23T05:43:00Z'
- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: PFY
  measured_at: '2017-03-23T05:43:00Z'

## Specimen

- name: Silicon dioxide (amorphous)
  description: powder, on carbon tape
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q735
  material_type_description: Oxide

## Chemical composition

- identifier: 112945-52-5
  category_vocabulary: http://matvoc.nims.go.jp/entity/Q2367

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2501
  description: Si K-edge

## Software



## Custom property



## Fileset

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  content_type: image/png
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## Thumbnail

fileset_id: 6ea68ae1-dee1-4b21-88a0-2e5489c3937e
filename: BL10_Si-K_004_tey.png