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説明:

Visualizing spin-polarized electronic states aids in designing and developing new materials and devices. Spin-resolved photoemission spectroscopy provides information on the spin-polarized electronic states. To investigate the spin-polarized electronic states in microscopic materials and devices, spin-resolved photoemission spectroscopy requires spatial resolution in a sub-micrometer scale. Here we show the imaging-type spin-resolved photoemission microscopy (iSPEM) with an ultraviolet laser developed at the National Institutes for Materials Science (NIMS). Our iSPEM achieves a spatial resolution of 420 nm, drastically improving by more than an order of magnitude compared to conventional spin-resolved photoemission spectroscopy instruments. Besides, the multi-channel spin detector significantly reduces the data acquisition time by four orders of magnitude compared to the conventional instruments. The iSPEM machine elucidates the spin-polarized electronic states of sub-micrometer scale materials, polycrystals, device structure samples, and so on, which have yet to be the target of conventional spin-resolved photoemission spectroscopy.

権利情報:

• Creative Commons BY-NC Attribution-NonCommercial 4.0 International
  

キーワード: Spin-resolved photoemission microscopy, Spin-polarized electronic state, High spatial resolution, Multichannel spin detection

刊行年月日: 2024-12-31

出版者: Taylor and Francis

掲載誌:

• Science and Technology of Advanced Materials: Methods (ISSN: 27660400) vol. 4 issue. 1 2328206

研究助成金:

• Japan Society for the Promotion of Science JP21K04633
• Iketani Science and Technology Foundation
• ATLA JPJ004596

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1080/27660400.2024.2328206

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更新時刻: 2024-04-04 16:30:18 +0900

MDRでの公開時刻: 2024-04-04 16:30:19 +0900