# Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams

https://mdr.nims.go.jp/datasets/bbe7bc67-1ffa-4970-92be-803856a98fd2

## File

- [Manuscript(Rapid measurement of low-order aberrations using crystalline Ronchigrams).pdf](https://mdr.nims.go.jp/filesets/ff7dab01-2d9b-418c-b76b-b0fdbcbac763/download) ([Detail](https://mdr.nims.go.jp/filesets/ff7dab01-2d9b-418c-b76b-b0fdbcbac763.md))

## Id

bbe7bc67-1ffa-4970-92be-803856a98fd2

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2022-06-20T04:43:08.690263Z

## Updated at

2024-01-05T13:13:14.678055Z

## Published at

2022-08-02T06:17:13.647176Z

## Doi

https://doi.org/10.48505/nims.3706

## First published url

https://doi.org/10.1016/j.ultramic.2017.03.021

## Date published

2017-03-18

## Recorded date published

2017-9

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Rapid measurement of low-order aberrations using Fourier transforms of crystalline
    Ronchigrams
  title_type: original
  lang: en

## Description

- description: The aberrations of the objective lens should be measured and adjusted
    to realize high spatial resolution in scanning transmission electron microscopy
    (STEM). Here we report a method of measuring low-order aberrations using the Fourier
    transforms of Ronchigrams of an arbitrary crystal such as a specimen of interest.
    We have applied this technique to measure first and second-order geometrical aberrations
    using typical standard specimens. Focus and twofold astigmatism are measured using
    two Ronchigrams obtained under different foci. Axial coma and threefold astigmatism
    are evaluated using the Fourier transforms of small subareas of a Ronchigram.
    The time dependences of focus and twofold astigmatism are examined using this
    technique for an aberration-corrected microscope.
  description_type: abstract
  lang: en

## Creator

- name: Koji Kimoto
  role: author
  orcid: https://orcid.org/0000-0002-3927-0492
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Kazuo Ishizuka
  role: author
  organization: HREM Research (Japan)

## Contact agent



## Publisher

organization: Elsevier BV

## Managing organization



## Keyword

- subject: STEM
  schema: not_defined
- subject: alignment
  schema: not_defined
- subject: Ronchigram
  schema: not_defined
- subject: Aberration
  schema: not_defined

## Rights

- description: Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  identifier: https://creativecommons.org/licenses/by-nc-nd/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Ultramicroscopy
  issn: '03043991'
  volume: '180'
  start_page: 59
  end_page: 65

## Conference



## Related item

- identifier: https://doi.org/10.1016/j.ultramic.2017.03.021
  identifier_type: DOI
  relation_type: is_version_of
  related_item_type: dataset

## Funding

- identifier: JPMJCR0603
  funder_name: JST
  description: CREST ソフトマターの分子・原子レベルでの観察を可能にする低加速高感度電子顕微鏡開発（代表者末永和知）

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software

- name: DigitalMicrograph
  description: Gatan

## Custom property



## Fileset

- id: ff7dab01-2d9b-418c-b76b-b0fdbcbac763
  filename: Manuscript(Rapid measurement of low-order aberrations using crystalline
    Ronchigrams).pdf
  content_type: application/pdf
  size: 941001
  md5: fa89f2379f180c2f54c60e1e4fa88e0d

## Thumbnail

fileset_id: ff7dab01-2d9b-418c-b76b-b0fdbcbac763
filename: Manuscript(Rapid measurement of low-order aberrations using crystalline
  Ronchigrams).pdf