# Systematic characterization of nanoscale <math display="inline">  <mi>h</mi></math>-BN quantum sensor spots created by helium-ion microscopy

https://mdr.nims.go.jp/datasets/b278a733-2094-41aa-97a6-8e89d85119b9

## File

- [2411.10717v1.pdf](https://mdr.nims.go.jp/filesets/f535256f-e3cb-4ca9-940c-49321d3d77c0/download) ([Detail](https://mdr.nims.go.jp/filesets/f535256f-e3cb-4ca9-940c-49321d3d77c0.md))

## Id

b278a733-2094-41aa-97a6-8e89d85119b9

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-11-18T06:17:32.550133Z

## Updated at

2025-01-09T07:30:55.779143Z

## Published at

2025-01-09T07:30:55.868366Z

## Doi



## First published url

https://doi.org/10.1103/physrevapplied.22.054026

## Date published

2024-11-12

## Recorded date published

2024-11

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: "Systematic characterization of nanoscale \n<mml:math xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"
    display=\"inline\" overflow=\"scroll\"><mml:mi>h</mml:mi></mml:math>\n-BN quantum
    sensor spots created by helium-ion microscopy"
  title_type: original
  lang: en

## Description

- description: 'The nanosized boron vacancy (V−B) defect spot in hexagonal boron nitride
    (h-BN) is promising for a local magnetic field quantum sensor. One of its advantages
    is that a helium-ion microscope can make a spot at any location in an h-BN flake
    with nanometer accuracy. In this study, we investigate the properties of the created
    nanosized V−B defect spots by systematically varying three conditions: the helium-ion
    dose, the thickness of the h-BN flakes, and the substrate on which the h-BN flakes
    are attached. The physical background of the results obtained is successfully
    interpreted using Monte Carlo calculations. From the findings obtained here, a
    guideline for their optimal creation conditions is obtained to maximize its performance
    as a quantum sensor concerning sensitivity and localization.'
  description_type: abstract
  lang: und

## Creator

- name: Hao Gu
  role: author
- name: Moeta Tsukamoto
  role: author
  orcid: https://orcid.org/0000-0002-0708-6308
- name: Yuki Nakamura
  role: author
  orcid: https://orcid.org/0000-0002-9038-468X
- name: Shu Nakaharai
  role: author
  orcid: https://orcid.org/0000-0002-6329-3942
- name: Takuya Iwasaki
  role: author
  orcid: https://orcid.org/0000-0002-1103-2433
- name: Kenji Watanabe
  role: author
  orcid: https://orcid.org/0000-0003-3701-8119
- name: Takashi Taniguchi
  role: author
  orcid: https://orcid.org/0000-0002-1467-3105
- name: Shinichi Ogawa
  role: author
- name: Yukinori Morita
  role: author
- name: Kento Sasaki
  role: author
  orcid: https://orcid.org/0000-0002-5880-2116
- name: Kensuke Kobayashi
  role: author
  orcid: https://orcid.org/0000-0001-7072-5945

## Contact agent



## Publisher

organization: American Physical Society (APS)

## Managing organization



## Keyword

- subject: quantum sensor
  schema: not_defined
- subject: hexagonal boron nitride
  schema: not_defined
- subject: helium ion microscopy
  schema: not_defined

## Rights

- identifier: http://arxiv.org/licenses/nonexclusive-distrib/1.0/

## Other identifier(s)



## Data origin



## Embargo



## Journal

- title: Physical Review Applied
  issn: '23317019'
  volume: '22'
  issue: '5'
  article_number: '054026'

## Conference



## Related item



## Funding

- funder_name: JST
- identifier: JPMJCR23I2
  funder_name: CREST
- identifier: JP24KJ0692
  funder_name: Grants-in-Aid for Scientific Research
- identifier: JP24KJ0880
  funder_name: Grants-in-Aid for Scientific Research
- identifier: JP22K03524
  funder_name: Grants-in-Aid for Scientific Research
- identifier: JP22KJ1059
  funder_name: Grants-in-Aid for Scientific Research
- identifier: JP19H00656
  funder_name: Grants-in-Aid for Scientific Research
- identifier: JP23K25800
  funder_name: Grants-in-Aid for Scientific Research
- identifier: JPMXP1222UT1131
  funder_name: Advanced Research Infrastructure for Materials and Nanotechnology in
    Japan
- funder_name: JSR Fellowship
- identifier: JP19H05826
  funder_name: Grants-in-Aid for Scientific Research
- identifier: 21H05233
  funder_name: Grants-in-Aid for Scientific Research
- identifier: 23H02052
  funder_name: Grants-in-Aid for Scientific Research
- funder_name: Ministry of Education, Culture, Sports, Science and Technology of Japan
- identifier: '202310021'
  funder_name: Mitsubishi Foundation

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: f535256f-e3cb-4ca9-940c-49321d3d77c0
  filename: 2411.10717v1.pdf
  content_type: application/pdf
  size: 1828421
  md5: 4521902262785712f60c4c4647be3b65

## Thumbnail

fileset_id: f535256f-e3cb-4ca9-940c-49321d3d77c0
filename: 2411.10717v1.pdf