# Influence of Fermi level pinning on contact potential difference measurements using Kelvin probe force microscopy

https://mdr.nims.go.jp/datasets/aec52709-2acb-4fe7-a0bc-9742174c369b

## File

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- [s-info1.pdf](https://mdr.nims.go.jp/filesets/1e7d56a2-12b4-403e-ae4c-32a4b9e9aa65/download) ([Detail](https://mdr.nims.go.jp/filesets/1e7d56a2-12b4-403e-ae4c-32a4b9e9aa65.md))

## Id

aec52709-2acb-4fe7-a0bc-9742174c369b

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-03-10T01:05:50.766477Z

## Updated at

2025-03-10T07:30:14.028020Z

## Published at

2025-03-10T07:30:15.278996Z

## Doi

https://doi.org/10.48505/nims.5358

## First published url

https://doi.org/10.1103/physrevb.111.125304

## Date published

2025-03-07

## Recorded date published

2025-3

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Influence of Fermi level pinning on contact potential difference measurements
    using Kelvin probe force microscopy
  title_type: original
  lang: en

## Description

- description: We theoretically investigated the influence of Fermi-level pinning
    on contact potential difference (CPD) measurements conducted via Kelvin probe
    force microscopy (KPFM) on semiconductor surfaces. To systematically modulate
    the strength of the surface pinning, virtual surface states were introduced within
    the semiconductor bandgap, and the density of states (DOS) was varied. The numerically
    simulated CPD values varied depending on the DOS of the surface states, reflecting
    the magnitude of the surface band bending (surface potential). However, we found
    that under certain conditions, the CPD values obtained by KPFM deviated from the
    physical quantities directly associated with the surface potential. Our results
    provide valuable insights for enhancing the accuracy of KPFM data analysis and
    interpretation.
  description_type: abstract
  lang: und

## Creator

- name: Nobuyuki Ishida
  role: author
  orcid: https://orcid.org/0000-0003-0161-0583

## Contact agent



## Publisher

organization: American Physical Society (APS)

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## Keyword

- subject: Kelvin probe force microscopy
  schema: not_defined
- subject: Simulation
  schema: not_defined
- subject: Electrostatic force
  schema: not_defined
- subject: Fermi level pinning
  schema: not_defined

## Rights

- description: "©2025 American Physical Society"
  identifier: http://rightsstatements.org/vocab/InC/1.0/

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## Embargo



## Journal

- title: Physical Review B
  issn: '24699950'
  volume: '111'
  issue: '12'
  article_number: '125304'

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## Related item



## Funding

- identifier: JP17K06366
  funder_name: Japan Society for the Promotion of Science
- identifier: JP21H01818
  funder_name: Japan Society for the Promotion of Science
- identifier: JP24K01367
  funder_name: Japan Society for the Promotion of Science

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## Fileset

- id: 99712a8b-806c-4fea-b4ae-bc43768c438b
  filename: draft010_MDR.pdf
  content_type: application/pdf
  size: 350396
  md5: 8ce2412c6344be92d38aaf0218be8100
- id: 1e7d56a2-12b4-403e-ae4c-32a4b9e9aa65
  filename: s-info1.pdf
  content_type: application/pdf
  size: 252165
  md5: 62dbbd54a9240685e899c567865cc413

## Thumbnail

fileset_id: 99712a8b-806c-4fea-b4ae-bc43768c438b
filename: draft010_MDR.pdf