XAFS spectrum of SUS316L

Toshihiko Yokoyama

doi:10.48505/nims.3630

Dataset XAFS spectrum of SUS316L

Toshihiko Yokoyama (Institute for Molecular Science)

Download all files
(zip, 17.9 KB)

Collection

MDR XAFS DB

Citation

Toshihiko Yokoyama. XAFS spectrum of SUS316L. https://doi.org/10.48505/nims.3630

(BibTeX)

Alternative title: KEKPF-BL9C_15221

Description:

(abstract)

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ni K-edge of SUS316L measured at Photon Factory BL-9C, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR

Data origin type: experiment

Rights:

Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International
Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International

Keyword: SUS316L, Ni K-edge, Alloy, Si(111), BL-9C, Photon Factory, XAFS, collection - MDR XAFS DB

Date published:

Publisher: KEK

Journal:

Funding:

Manuscript type: Not a journal article

MDR DOI: https://doi.org/10.48505/nims.3630

First published URL:

Related item:

Other identifier(s):

Contact agent: Photon Factory (KEK)

Updated at: 2023-06-16 21:27:11 +0900

Published on MDR: 2022-07-11 11:48:50 +0900

Specimen / 試料

Name / 名称 : SUS316L

Description / 試料の説明 :

Material type / 試料種別 :

Material type description / 試料種別の説明 :

Identifier / 識別子 :

Chemical composition / 試料の化学組成

Specimen ID / 試料ID :

Description / 化学組成の説明 :

Category / カテゴリ : SUS316L

Category description / カテゴリの説明 :

Chemical composition ID / 組成ID :

Structural feature for specimen / 試料の構造的特徴

Specimen ID / 試料ID :

Description / 構造的特徴の説明 : local structure

Category / カテゴリ : local structure

Category description / カテゴリの説明 :

Instrument / 装置

Name / 装置の名称 : BL-9C_XAFS

Manufacturer / 装置製作者 : Photon Factory

Model number / 型番 :

Description / 装置の説明 : Photon Factory Hard X-ray Beamline XAFS setup

Function / 機能 :

Function description / 機能の説明 : x-ray absorption spectroscopy

Instrument ID / 装置ID :

Instrument operator / 装置操作者 :

Instrument managing organization / 装置管理組織 : Institute of Materials Structure Science, KEK

Measurement method / 計測法

Description / 説明 : spectroscopy -- x-ray absorption spectroscopy

Category / カテゴリ : x-ray absorption spectroscopy

Category description / カテゴリの説明 :

Analysis field / 解析分野 :

Analysis field description / 解析分野の説明 :

Measurement environment / 計測環境 :

Standarized procedure / 標準手順 :

Measured at / 計測時刻 :

primary.tsv

key	value

Filename	Size
Filename	Ni03.dat application/octet-stream	Size	31.5 KB	Detail
Filename	metadata.json application/json	Size	4.71 KB	Detail
Filename	metadata.yml application/octet-stream	Size	2.6 KB	Detail
Filename	primary.tsv text/tab-separated-values	Size	3.86 KB	Detail
Filename	thumbnail.png (Thumbnail) image/png	Size	8.21 KB	Detail