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説明:

The crystallographic features of microstructurally small fatigue cracks (MSFCs) in a Ni-Co-based superalloy were analyzed by using a Xe plasma focused ion beam scanning electron microscope (PFIB-SEM) system in conjunction with electron backscatter diffraction (EBSD) analysis. The crystallographic orientation of the three-dimensional (3D) fatigue crack growth path was successfully observed using a large-volume, high-resolution 3D image. The major parts of the crack surface were close to the {111} slip plane. Our results indicated that the Mode II fatigue crack growth mechanism is locally more predominant than the general blunting-resharpening Mode I fatigue crack growth mechanism, not only in the Stage I region but also in the larger part of the Stage II region of MSFC growth process.

権利情報:

• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  © 2022. This manuscript version is made available under the CC-BY-NC-ND 4.0 license https://creativecommons.org/licenses/by-nc-nd/4.0/

キーワード: Small fatigue crack, Crystal orientation, 3D observation, PFIB-SEM, Ni-Co-based superalloy

刊行年月日: 2022-09-05

出版者: Elsevier BV

掲載誌:

• SCRIPTA MATERIALIA (ISSN: 13596462) vol. 222 p. 115026-115026

研究助成金:

• JST (This work was supported by the Council for Science, Technology and Innovation (CSTI), the Cross-ministerial Strategic Innovation Promotion Program (SIP), “Structural Materials for Innovation” (Funding agency: JST). )

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4288

公開URL: https://doi.org/10.1016/j.scriptamat.2022.115026

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更新時刻: 2024-09-10 08:53:40 +0900

MDRでの公開時刻: 2024-09-05 08:30:25 +0900