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代替タイトル: 収差補正透過電子顕微鏡法を用いた六方晶窒化ホウ素の元素識別

説明:

Boron nitride nanosheets prepared by an exfoliation technique were observed by aberration
corrected transmission electron microscopy at 300 kV acceleration voltage. Single boron and nitrogen atoms in a monolayer region were imaged with different image contrast; a boron atom gave 16% less contrast than a nitrogen atom. The number of atoms at each hexagonal ring site was determined by the image intensity that changed discretely with a 0.25 - 0.30 intensity difference. A double BN sheet was found to have a boron vacancy layer, and a triple BN layer has also a boron deficient layer on the incident surface resulting from the electron beam thinning process. The high sensitivity for atomic species was achieved by the high resolution and a small information limit due to the use of a cold field emission electron source.

権利情報:

• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

キーワード: High resolution, Aberration corrector, Boron nitride, Nanosheet

刊行年月日: 2012-08-02

出版者: Elsevier BV

掲載誌:

• ULTRAMICROSCOPY (ISSN: 03043991) vol. 122 p. 6-11

研究助成金:

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4419

公開URL: https://doi.org/10.1016/j.ultramic.2012.07.028

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更新時刻: 2024-03-05 08:30:16 +0900

MDRでの公開時刻: 2024-03-05 08:30:16 +0900