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説明:

We present and apply a new type of opto-electronic nanoscopy to measure locally both the optical and electronic properties of graphene devices. This is achieved by combining scanning near-field infrared nanoscopy with electrical device read-out, allowing infrared photocurrent mapping at length scales of tens of nanometers. We apply this technique to study the impact of edges and grain boundaries on spatial carrier density profiles and local thermoelectric properties.

権利情報:

• Creative Commons BY Attribution 4.0 International
  

キーワード: Optoelectronic devices, graphene, nanoscale variations

刊行年月日: 2016-02-26

出版者: Springer Science and Business Media LLC

掲載誌:

• Nature Communications (ISSN: 20411723) vol. 7 10783

研究助成金:

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1038/ncomms10783

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更新時刻: 2025-02-27 12:30:51 +0900

MDRでの公開時刻: 2025-02-27 12:30:51 +0900