Achim Woessner
;
Pablo Alonso-González
;
Mark B. Lundeberg
;
Yuanda Gao
;
Jose E. Barrios-Vargas
;
Gabriele Navickaite
;
Qiong Ma
;
Davide Janner
;
Kenji Watanabe
(National Institute for Materials Science
)
;
Aron W. Cummings
;
Takashi Taniguchi
(National Institute for Materials Science
)
;
Valerio Pruneri
;
Stephan Roche
;
Pablo Jarillo-Herrero
;
James Hone
;
Rainer Hillenbrand
;
Frank H. L. Koppens
説明:
(abstract)We present and apply a new type of opto-electronic nanoscopy to measure locally both the optical and electronic properties of graphene devices. This is achieved by combining scanning near-field infrared nanoscopy with electrical device read-out, allowing infrared photocurrent mapping at length scales of tens of nanometers. We apply this technique to study the impact of edges and grain boundaries on spatial carrier density profiles and local thermoelectric properties.
権利情報:
キーワード: Optoelectronic devices, graphene, nanoscale variations
刊行年月日: 2016-02-26
出版者: Springer Science and Business Media LLC
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1038/ncomms10783
関連資料:
その他の識別子:
連絡先:
更新時刻: 2025-02-27 12:30:51 +0900
MDRでの公開時刻: 2025-02-27 12:30:51 +0900
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|---|---|---|---|---|
| ファイル名 |
ncomms10783.pdf
(サムネイル)
application/pdf |
サイズ | 1.11MB | 詳細 |