# Phonon Lifetime Observation in Epitaxial ScN Film with Inelastic X-Ray Scattering Spectroscopy

https://mdr.nims.go.jp/datasets/a0cb9988-c666-4011-8256-aded90e6ffc1

## File

- [PhysRevLett.120.235901.pdf](https://mdr.nims.go.jp/filesets/0c316bf9-8934-451e-8424-8a564c6822d0/download) ([Detail](https://mdr.nims.go.jp/filesets/0c316bf9-8934-451e-8424-8a564c6822d0.md))

## Id

a0cb9988-c666-4011-8256-aded90e6ffc1

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-01-05T15:09:30.790291Z

## Updated at

2024-01-31T00:15:10.153037Z

## Published at

2024-01-31T03:30:17.107860Z

## Doi



## First published url

https://doi.org/10.1103/PhysRevLett.120.235901

## Date published

2018-06-07

## Recorded date published

2018-6

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: ScNエピタキシャル膜におけるフォノン寿命の非弾性X線散乱による測定
  title_type: alternative
  lang: ja
- title: Phonon Lifetime Observation in Epitaxial ScN Film with Inelastic X-Ray Scattering
    Spectroscopy
  title_type: original
  lang: en

## Description

- description: "Phonon-phonon scattering dominates the thermal properties in nonmetallic
    materials, and it directly influences device performance in applications. The
    understanding of the scattering has been progressing using computational approaches,
    and the direct and systematic observation of phonon modes that include momentum
    dependences is desirable. We report experimental data on the phonon dispersion
    curves and lifetimes in an epitaxially grown ScN film using inelastic x-ray scattering
    measurements. The momentum dependence of the optical phonon lifetimes is estimated
    from the spectral width, and the highest-energy phonon mode around the zone center
    is found to possess a short lifetime of 0.21 ps. A comparison with\r\nfirst-principles
    calculations shows that our observed phonon lifetimes are quantitati"
  description_type: abstract
  lang: eng

## Creator

- name: H. Uchiyama
  role: author
- name: Y. Oshima
  role: author
  orcid: https://orcid.org/0000-0001-8293-4891
  organization: National Institute for Materials Science
- name: R. Patterson
  role: author
- name: S. Iwamoto
  role: author
- name: J. Shiomi
  role: author
- name: K. Shimamura
  role: author
  orcid: https://orcid.org/0000-0001-6502-8731
  organization: National Institute for Materials Science

## Contact agent



## Publisher

organization: American Physical Society (APS)

## Managing organization



## Keyword

- subject: ScN
  schema: not_defined
- subject: phonon
  schema: not_defined

## Rights

- identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin



## Embargo



## Journal

- title: PHYSICAL REVIEW LETTERS
  issn: '00319007'
  volume: '120'
  issue: '23'
  start_page: 235901
  end_page: 235901

## Conference



## Related item



## Funding



## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 0c316bf9-8934-451e-8424-8a564c6822d0
  filename: PhysRevLett.120.235901.pdf
  content_type: application/pdf
  size: 627210
  md5: 947164568694c22d0a83c365960c8bfe

## Thumbnail

fileset_id: 0c316bf9-8934-451e-8424-8a564c6822d0
filename: PhysRevLett.120.235901.pdf