Article Phonon Lifetime Observation in Epitaxial ScN Film with Inelastic X-Ray Scattering Spectroscopy

H. Uchiyama ; Y. Oshima SAMURAI ORCID (National Institute for Materials Science) ; R. Patterson ; S. Iwamoto ; J. Shiomi ; K. Shimamura SAMURAI ORCID (National Institute for Materials Science)

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Citation
H. Uchiyama, Y. Oshima, R. Patterson, S. Iwamoto, J. Shiomi, K. Shimamura. Phonon Lifetime Observation in Epitaxial ScN Film with Inelastic X-Ray Scattering Spectroscopy. PHYSICAL REVIEW LETTERS. 2018, 120 (23), 235901-235901.
SAMURAI

Alternative title: ScNエピタキシャル膜におけるフォノン寿命の非弾性X線散乱による測定

Description:

(abstract)

Phonon-phonon scattering dominates the thermal properties in nonmetallic materials, and it directly influences device performance in applications. The understanding of the scattering has been progressing using computational approaches, and the direct and systematic observation of phonon modes that include momentum dependences is desirable. We report experimental data on the phonon dispersion curves and lifetimes in an epitaxially grown ScN film using inelastic x-ray scattering measurements. The momentum dependence of the optical phonon lifetimes is estimated from the spectral width, and the highest-energy phonon mode around the zone center is found to possess a short lifetime of 0.21 ps. A comparison with
first-principles calculations shows that our observed phonon lifetimes are quantitati

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Keyword: ScN, phonon

Date published: 2018-06-07

Publisher: American Physical Society (APS)

Journal:

  • PHYSICAL REVIEW LETTERS (ISSN: 00319007) vol. 120 issue. 23 p. 235901-235901

Funding:

Manuscript type: Publisher's version (Version of record)

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First published URL: https://doi.org/10.1103/PhysRevLett.120.235901

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Updated at: 2024-01-31 09:15:10 +0900

Published on MDR: 2024-01-31 12:30:17 +0900

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