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代替タイトル: ScNエピタキシャル膜におけるフォノン寿命の非弾性X線散乱による測定

説明:

Phonon-phonon scattering dominates the thermal properties in nonmetallic materials, and it directly influences device performance in applications. The understanding of the scattering has been progressing using computational approaches, and the direct and systematic observation of phonon modes that include momentum dependences is desirable. We report experimental data on the phonon dispersion curves and lifetimes in an epitaxially grown ScN film using inelastic x-ray scattering measurements. The momentum dependence of the optical phonon lifetimes is estimated from the spectral width, and the highest-energy phonon mode around the zone center is found to possess a short lifetime of 0.21 ps. A comparison with
first-principles calculations shows that our observed phonon lifetimes are quantitati

権利情報:

• In Copyright
  

キーワード: ScN, phonon

刊行年月日: 2018-06-07

出版者: American Physical Society (APS)

掲載誌:

• PHYSICAL REVIEW LETTERS (ISSN: 00319007) vol. 120 issue. 23 p. 235901-235901

研究助成金:

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1103/PhysRevLett.120.235901

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更新時刻: 2024-01-31 09:15:10 +0900

MDRでの公開時刻: 2024-01-31 12:30:17 +0900