論文 Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis

Koji Kimoto SAMURAI ORCID (Center for Basic Research On Materials, National Institute for Materials Science (NIMS)) ; Jun Kikkawa SAMURAI ORCID (Center for Basic Research On Materials, National Institute for Materials Science (NIMS)) ; Koji Harano SAMURAI ORCID (Center for Basic Research On Materials, National Institute for Materials Science (NIMS)) ; Ovidiu Cretu SAMURAI ORCID (Center for Basic Research On Materials, National Institute for Materials Science (NIMS)) ; Yuki Shibazaki ORCID ; Fumihiko Uesugi SAMURAI ORCID (Research Network and Facility Service Division, National Institute for Materials Science (NIMS))

コレクション

引用
Koji Kimoto, Jun Kikkawa, Koji Harano, Ovidiu Cretu, Yuki Shibazaki, Fumihiko Uesugi. Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis. Scientific Reports. 2024, 14 (), 2901. https://doi.org/10.1038/s41598-024-53289-5
SAMURAI

説明:

(abstract)

Unsupervised machine learning techniques have been combined with scanning transmission electron microscopy (STEM) to enable comprehensive crystal structure analysis with nanometer spatial resolution. In this study, we investigated large-scale data obtained by four-dimensional (4D) STEM using dimensionality reduction techniques such as non-negative matrix factorization (NMF) and hierarchical clustering with various optimization methods. We developed software scripts incorporating knowledge of electron diffraction and STEM imaging for data preprocessing, NMF, and hierarchical clustering. Hierarchical clustering was performed using cross-correlation instead of conventional Euclidean distances, resulting in rotation-corrected diffractions and shift-corrected maps of major components. An experimental analysis was conducted on a high-pressure-annealed metallic glass, Zr-Cu-Al, revealing an amorphous matrix and crystalline precipitates with an average diameter of approximately 7 nm, which were challenging to detect using conventional STEM techniques. Combining 4D-STEM and optimized unsupervised machine learning enables comprehensive bimodal (i.e., spatial and reciprocal) analyses of material nanostructures.

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キーワード: Scanning Transmission Electron Microscopy, Unsupervised Machine Learning, 4D-STEM, Non-negative Matrix Factorization, Hierachical Clustering, Metallic Glass

刊行年月日: 2024-02-05

出版者: Springer Science and Business Media LLC

掲載誌:

  • Scientific Reports (ISSN: 20452322) vol. 14 2901

研究助成金:

  • Japan Society for the Promotion of Science JP 22H05145
  • Japan Society for the Promotion of Science 20H02624
  • Japan Society for the Promotion of Science JP23H04874

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1038/s41598-024-53289-5

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更新時刻: 2024-02-15 16:30:11 +0900

MDRでの公開時刻: 2024-02-15 16:30:11 +0900

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