Martin Markwitz
;
Song Yi Back
(National Institute for Materials Science)
;
Edward X. M. Trewick
;
Peter P. Murmu
;
Takao Mori
(National Institute for Materials Science)
;
Ben J. Ruck
;
John V. Kennedy
説明:
(abstract)The band non-parabolicity of tin-doped indium oxide (ITO) polycrystalline thin films is investigated with the quasi-linear Kane model through Seebeck and Hall effect measurements. We report Kane model non-parabolic band parameters of m∗0 = 0.21 m0 and C = 0.52 eV-1 for ITO, in good agreement with historical photoemission, optical, and transport measurements. To do this, the ITO films were doped with nitrogen by ion implantation, with fluences ranging from 5 × 1014 N cm-2 to 5 × 1015 N cm-2. The presence of the nitrogen in the films was verified with X-ray photoelectron spectroscopy, and their acceptor character studied theoretically by density functional theory. Experimentally, the doped nitrogen formed NO- defects, deep acceptor states that led to a controlled compensation in carrier concentration from 10.1×1020±0.6×1020 cm-3 to 2.9×1020±0.2×1020 cm-3. Understanding the band non-parabolicity of degenerately doped transparent conducting oxides is essential for their commercial application in solar cells, transparent thermoelectric generators, and transparent thin film transistors, and by this work, the Seebeck and Hall effect approach with the quasi-linear Kane model for band non-parabolicity is presented as a practical method by which to study the variation in carrier effective mass without reliance on optical measurements.
権利情報:
キーワード: 熱電材料
刊行年月日: 2024-03-05
出版者: American Physical Society (APS)
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4609
公開URL: https://doi.org/10.1103/physrevb.109.115201
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-07-31 12:30:14 +0900
MDRでの公開時刻: 2024-07-31 12:30:15 +0900
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ITON_PRB_16_01_2024.pdf
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サイズ | 15.1MB | 詳細 |
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ITON_PRB_resubmittedSI.docx
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サイズ | 2.93MB | 詳細 |