# XAFS spectrum of Nickel(II) oxide

https://mdr.nims.go.jp/datasets/9f839f06-2b05-4c0d-91e9-59779b8cadea

## File

- [metadata.all.json](https://mdr.nims.go.jp/filesets/d6e67ae2-e3c3-4968-82a8-df4c3bf6d6a9/download) ([Detail](https://mdr.nims.go.jp/filesets/d6e67ae2-e3c3-4968-82a8-df4c3bf6d6a9.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/b2a1c00c-bf65-4d94-9386-994f001362a3/download) ([Detail](https://mdr.nims.go.jp/filesets/b2a1c00c-bf65-4d94-9386-994f001362a3.md))
- [Ni-K_NiO_Si111_10ms_131127.ex3](https://mdr.nims.go.jp/filesets/0a429d85-5115-45fa-9489-54ce78c0e06e/download) ([Detail](https://mdr.nims.go.jp/filesets/0a429d85-5115-45fa-9489-54ce78c0e06e.md))
- [Ni-K_NiO_Si111_10ms_131127.txt](https://mdr.nims.go.jp/filesets/168ad586-f888-49a0-8b86-42b932a7d514/download) ([Detail](https://mdr.nims.go.jp/filesets/168ad586-f888-49a0-8b86-42b932a7d514.md))
- [Ni-K_NiO_Si111_10ms_131127.dat](https://mdr.nims.go.jp/filesets/1d747728-b2ba-4ba5-be41-d46cce636d7c/download) ([Detail](https://mdr.nims.go.jp/filesets/1d747728-b2ba-4ba5-be41-d46cce636d7c.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/f0704896-9f1f-4eb7-bbcb-fb885913189c/download) ([Detail](https://mdr.nims.go.jp/filesets/f0704896-9f1f-4eb7-bbcb-fb885913189c.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/4a8ba0e0-b103-44b8-89c5-70d4db796145/download) ([Detail](https://mdr.nims.go.jp/filesets/4a8ba0e0-b103-44b8-89c5-70d4db796145.md))
- [NiO.thumb.png](https://mdr.nims.go.jp/filesets/0d839c9f-c990-4c64-8424-661159de4e90/download) ([Detail](https://mdr.nims.go.jp/filesets/0d839c9f-c990-4c64-8424-661159de4e90.md))

## Id

9f839f06-2b05-4c0d-91e9-59779b8cadea

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:35:29.451121Z

## Updated at

2025-05-02T12:55:20.851671Z

## Published at

2021-08-12T16:08:41.531675Z

## Doi

https://doi.org/10.48505/nims.3001

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-23

## Recorded date published

23/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: spring8.bb14a832-67a3-425b-9f75-11250bafc314
  title_type: alternative
  lang: en
- title: XAFS spectrum of Nickel(II) oxide
  title_type: original
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Ni K-edge of Nickel(II) oxide measured at SPring-8 BL14B2, and is a part of
    XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(111)
  schema: not_defined
- subject: NiO
  schema: not_defined
- subject: Ni K-edge
  schema: not_defined
- subject: Oxide
  schema: not_defined
- subject: Nickel(II) oxide
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2013-11-26T15:20:00Z'

## Specimen

- name: Nickel(II) oxide
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q735
  material_type_description: Oxide

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1631

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2515
  description: Ni K-edge

## Software



## Custom property



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## Thumbnail

fileset_id: 0d839c9f-c990-4c64-8424-661159de4e90
filename: NiO.thumb.png