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Practical techniques to identify heat routes on the nanoscale are required for the thermal control of microelectronic, thermoelectric, and photonic devices. Nanoscale thermometry using various approaches has been extensively investigated, yet such a method has not been reported. We developed a method using thermal waves induced by a pulsed convergent electron beam in a scanning transmission electron microscopy (STEM) mode at room temperature. By quantifying the relative phase delay at each irradiated position, we could demonstrate the heat transport within the specimens with a spatial resolution of ~10 nm and temperature resolution of 0.01 K. Phonon-surface scatterings were quantitatively confirmed due to the suppression of thermal diffusivity. The phonon-grain boundary scatterings and ballistic phonon transport near the pulsed convergent electron beam could be visualized.

権利情報:

• Creative Commons BY-NC Attribution-NonCommercial 4.0 International
  

キーワード: thermal diffusivity, pulsed electron beam, transmission electron microscopy, thermocouple, thermal conductivity

刊行年月日: 2024-01-12

出版者: American Association for the Advancement of Science (AAAS)

掲載誌:

• Science Advances (ISSN: 23752548) vol. 10 issue. 2 eadj3825

研究助成金:

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1126/sciadv.adj3825

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更新時刻: 2024-08-27 16:30:43 +0900

MDRでの公開時刻: 2024-08-27 16:30:43 +0900