# Torsional force microscopy of van der Waals moirés and atomic lattices

https://mdr.nims.go.jp/datasets/9a1bf707-d96e-474a-a482-0f73bd223e9f

## File

- [pendharkar-et-al-2024.pdf](https://mdr.nims.go.jp/filesets/70bb45b0-3ff3-47fd-a5db-4d92551c8326/download) ([Detail](https://mdr.nims.go.jp/filesets/70bb45b0-3ff3-47fd-a5db-4d92551c8326.md))

## Id

9a1bf707-d96e-474a-a482-0f73bd223e9f

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-02-18T02:00:47.061040Z

## Updated at

2025-02-23T13:46:51.251260Z

## Published at

2025-02-23T13:46:51.342611Z

## Doi



## First published url

https://doi.org/10.1073/pnas.2314083121

## Date published

2024-03-05

## Recorded date published

2024-3-5

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Torsional force microscopy of van der Waals moirés and atomic lattices
  title_type: original
  lang: en

## Description

- description: Moiré superlattices formed in twisted Van der Waals’ materials have
    unlocked a new degree of freedom hitherto absent in condensed matter. Yet, techniques
    for precise, rapid and reliable imaging of the moir ́es formed have remained scarce.
    In this work, we demonstrate the use of Torsional Force Microscopy, a scanning
    probe technique that is sensitive to local dynamic friction and reveals the moir
    ́es formed between bi-layers of graphene and between graphene and hBN. Additionally,
    this technique has also been successful in imaging the atomic lattice of graphene
    and hBN. In TFM, the AFM cantilever is actively driven at one of its torsional
    resonance similar to non-contact AFM and a feedback loop maintains a constant
    vertical loading force, similar to contact AFM, controlling the interaction between
    the tip and the sample. By tracking the amplitude and phase of the driven torsional
    resonance, using the lateral signal from the photo detector, patterns consistent
    with both moir ́es and atomic lattices are routinely observed. Low loading forces
    are sensitive to moir ́es near the surface, while increased forces reveal buried
    moir ́es. TFM does not require an electrical bias between the tip and the sample,
    providing non-perturbative analysis with a high degree of repeatability across
    a wide variety 2D materials’ crystal lattices and moir ́es of their heterostructures,
    in operando.
  description_type: abstract
  lang: und

## Creator

- name: Mihir Pendharkar
  role: author
- name: Steven J. Tran
  role: author
- name: Gregory Zaborski
  role: author
- name: Joe Finney
  role: author
- name: Aaron L. Sharpe
  role: author
- name: Rupini V. Kamat
  role: author
- name: Sandesh S. Kalantre
  role: author
- name: Marisa Hocking
  role: author
- name: Nathan J. Bittner
  role: author
- name: Kenji Watanabe
  role: author
  orcid: https://orcid.org/0000-0003-3701-8119
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Takashi Taniguchi
  role: author
  orcid: https://orcid.org/0000-0002-1467-3105
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Bede Pittenger
  role: author
- name: Christina J. Newcomb
  role: author
- name: Marc A. Kastner
  role: author
- name: Andrew J. Mannix
  role: author
- name: David Goldhaber-Gordon
  role: author

## Contact agent



## Publisher

organization: Proceedings of the National Academy of Sciences

## Managing organization



## Keyword

- subject: van der Waals layers
  schema: not_defined
- subject: torsional force microscopy
  schema: not_defined
- subject: twist angle
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin



## Embargo



## Journal

- title: Proceedings of the National Academy of Sciences
  issn: '10916490'
  volume: '121'
  issue: '10'
  article_number: e2314083121

## Conference



## Related item



## Funding

- identifier: DE-AC02-76SF00515
  funder_name: U.S. Department of Energy
- identifier: ECCS-2026822
  funder_name: National Science Foundation
- identifier: GBMF9460
  funder_name: Gordon and Betty Moore Foundation
- identifier: DE-NA0003525
  funder_name: U.S. Department of Energy
- identifier: 23H02052
  funder_name: MEXT | Japan Society for the Promotion of Science

## Instrument



## Instrument operator



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## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



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## Process for specimen treatment



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## Fileset

- id: 70bb45b0-3ff3-47fd-a5db-4d92551c8326
  filename: pendharkar-et-al-2024.pdf
  content_type: application/pdf
  size: 15205133
  md5: 3a000e39b14322278fbf72217fa49c61

## Thumbnail

fileset_id: 70bb45b0-3ff3-47fd-a5db-4d92551c8326
filename: pendharkar-et-al-2024.pdf