# Pixel-Level Image-Based Analysis of Spatial Kinetics and Resistance Variation in a Large-Area Electrochromic Device

https://mdr.nims.go.jp/datasets/990935e2-d22f-4bb4-9344-e2309f320bb2

## File

- [pixel-level-image-based-analysis-of-spatial-kinetics-and-resistance-variation-in-a-large-area-electrochromic-device.pdf.pdf](https://mdr.nims.go.jp/filesets/a5f6fb46-04fb-4798-b72b-ab50c76227b5/download) ([Detail](https://mdr.nims.go.jp/filesets/a5f6fb46-04fb-4798-b72b-ab50c76227b5.md))

## Id

990935e2-d22f-4bb4-9344-e2309f320bb2

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-01-06T08:45:21.635832Z

## Updated at

2026-01-07T01:31:36.396448Z

## Published at

2026-01-07T03:22:00.841675Z

## Doi



## First published url

https://doi.org/10.1021/acsaelm.5c01754

## Date published

2025-12-09

## Recorded date published

2025-12-9

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Pixel-Level Image-Based Analysis of Spatial Kinetics and Resistance Variation
    in a Large-Area Electrochromic Device
  title_type: original
  lang: en

## Description

- description: Electrochromic (EC) materials and devices (ECDs) have been extensively
    studied, providing valuable insight into their optical switching properties and
    material characteristics. To analyse dynamic and subtle spatial variations during
    switching, we developed for the first time a non-invasive, automated, image-based
    methodology capable of resolving EC behavior at the pixel level. Grayscale images,
    extracted from video recordings at 0.0333 s intervals during cyclic operation,
    were segmented into 8,448 localized pixel positions to quantify contrast–time
    profiles. Firstly, switching non-uniformity was visualized, revealing reaction
    times from 0.8 to 2.0 s to reach 90% contrast change, with faster responses at
    the edges and slower transitions in the center. Secondly, segmental kinetics were
    evaluated by fitting time constants (τ) to each profile and linking them to composite
    resistances using a simplified RC model with a uniform areal capacitance (0.0133
    F cm⁻2). The edge segment exhibited lower τ (1.79) and resistance (134.5 Ω·cm2),
    whereas the central pixel position showed delayed switching (1.80 s) with larger
    τ (2.46) and higher resistance (184.9 Ω·cm2). Finally, spatial distributions were
    visualized through 2D heat maps, confirming slower central regions (1.60-1.95
    s), with regional average resistance 185.7 Ω·cm2 compared to lower-resistance
    peripheral regions (136.8–149.6 Ω·cm2). This non-invasive approach enables high-resolution
    diagnostic platform for quantifying uniformity, kinetics, and resistance distributions
    in large-area ECDs and is broadly applicable to diverse EC architectures influenced
    by spatial transport effects.
  description_type: abstract
  lang: und

## Creator

- name: Shifa Sarkar
  role: author
  orcid: https://orcid.org/0009-0008-4641-6569
- name: Takefumi Yoshida
  role: author
  orcid: https://orcid.org/0000-0003-3479-7890
- name: Banchhanidhi Prusti
  role: author
  orcid: https://orcid.org/0000-0003-4489-2509
- name: Satya Ranjan Jena
  role: author
  orcid: https://orcid.org/0009-0009-8344-6131
- name: Kuo-Chuan Ho
  role: author
  orcid: https://orcid.org/0000-0001-7501-1271
- name: Masayoshi Higuchi
  role: author
  orcid: https://orcid.org/0000-0001-9877-1134

## Contact agent



## Publisher

organization: American Chemical Society (ACS)

## Managing organization



## Keyword

- subject: Electrochromic device
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: ACS Applied Electronic Materials
  issn: '26376113'
  volume: '7'
  issue: '23'
  start_page: 10651
  end_page: 10663

## Conference



## Related item



## Funding

- identifier: JPMJMI21I4
  funder_name: JST-Mirai Program
- identifier: JPMEERF20221M02
  funder_name: Environmental Restoration and Conservation Agency

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: a5f6fb46-04fb-4798-b72b-ab50c76227b5
  filename: pixel-level-image-based-analysis-of-spatial-kinetics-and-resistance-variation-in-a-large-area-electrochromic-device.pdf.pdf
  content_type: application/pdf
  size: 1067117
  md5: 4c5aa49763ba3baf24266d85d536ea60

## Thumbnail

fileset_id: a5f6fb46-04fb-4798-b72b-ab50c76227b5
filename: pixel-level-image-based-analysis-of-spatial-kinetics-and-resistance-variation-in-a-large-area-electrochromic-device.pdf.pdf