# XAFS spectrum of Tantalum silicide

https://mdr.nims.go.jp/datasets/985a3d05-21fb-45ea-85f3-685f99ba2909

## File

- [metadata.all.json](https://mdr.nims.go.jp/filesets/c86f87a9-de60-445d-8ea6-15b604187b44/download) ([Detail](https://mdr.nims.go.jp/filesets/c86f87a9-de60-445d-8ea6-15b604187b44.md))
- [Ta-L1_TaSi2_Si311_100ms_200624.ex3](https://mdr.nims.go.jp/filesets/ab231059-1d43-49c9-9f35-6f601c48ac09/download) ([Detail](https://mdr.nims.go.jp/filesets/ab231059-1d43-49c9-9f35-6f601c48ac09.md))
- [Ta-L1_TaSi2_Si311_100ms_200624.txt](https://mdr.nims.go.jp/filesets/2ce61702-9d2a-4487-9030-486a64e80f31/download) ([Detail](https://mdr.nims.go.jp/filesets/2ce61702-9d2a-4487-9030-486a64e80f31.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/a71f1e8d-6f1e-4329-bbae-af2b8d9ddf21/download) ([Detail](https://mdr.nims.go.jp/filesets/a71f1e8d-6f1e-4329-bbae-af2b8d9ddf21.md))
- [Ta-L21_TaSi2_Si311_100ms_200624.dat](https://mdr.nims.go.jp/filesets/9c5de3a1-44be-4be8-9633-fb65a88eadcd/download) ([Detail](https://mdr.nims.go.jp/filesets/9c5de3a1-44be-4be8-9633-fb65a88eadcd.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/689cdded-a1a4-46b7-a87d-c8b4dcc30948/download) ([Detail](https://mdr.nims.go.jp/filesets/689cdded-a1a4-46b7-a87d-c8b4dcc30948.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/46fb9ceb-a34b-462d-a2fb-299b991aa40c/download) ([Detail](https://mdr.nims.go.jp/filesets/46fb9ceb-a34b-462d-a2fb-299b991aa40c.md))
- [TaSi2.thumb.png](https://mdr.nims.go.jp/filesets/60725854-48c6-4b7c-91d1-35f34bb35e9c/download) ([Detail](https://mdr.nims.go.jp/filesets/60725854-48c6-4b7c-91d1-35f34bb35e9c.md))

## Id

985a3d05-21fb-45ea-85f3-685f99ba2909

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:24:52.567713Z

## Updated at

2025-05-02T12:54:27.078222Z

## Published at

2021-08-12T16:08:41.220418Z

## Doi

https://doi.org/10.48505/nims.2883

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-21

## Recorded date published

21/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Tantalum silicide
  title_type: original
  lang: en
- title: spring8.5376d08a-cebf-45fc-9a47-29677cdba9be
  title_type: alternative
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Ta L21-edge of Tantalum silicide measured at SPring-8 BL14B2, and is a part
    of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(311)
  schema: not_defined
- subject: TaSi2
  schema: not_defined
- subject: Ta L21-edge
  schema: not_defined
- subject: Silicide
  schema: not_defined
- subject: Tantalum silicide
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2020-06-24T07:26:00Z'

## Specimen

- name: Tantalum silicide
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q744
  material_type_description: Silicide

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1718

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2722
  description: Ta L2-edge

## Software



## Custom property



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## Thumbnail

fileset_id: 60725854-48c6-4b7c-91d1-35f34bb35e9c
filename: TaSi2.thumb.png