@article{yamashita,
  title = {Detection limit of defect-induced strain in GaN evaluated by valence EELS and correlated structural analysis},
  author = {Shunsuke Yamashita, Jun Kikkawa, Susumu Kusanagi, Ichiro Nomachi, Ryoji Arai, Yuya Kanitani, Koji Kimoto, Yoshihiro Kudo},
  publisher = {Oxford University Press (OUP)},
  year = {2026},
  keywords = {Limit of detection, Detection threshold, Physical analysis, Gallium nitride, Valence electron energy loss spectroscopy (VEELS), Low-loss spectrum}
}