説明:
(abstract)Zinc oxide (ZnO) has garnered much attention as a promising material for quantum devices due to its unique characteristics. To utilize the potential of ZnO for quantum devices, the development of fundamental technological elements such as high-speed readout and charge sensing capabilities has become essential. In this study, we address these challenges by demonstrating radio-frequency (rf) reflectometry and charge sensing in ZnO quantum dots, thus advancing the potential for qubit applications. A device is fabricated on a high-quality ZnO heterostructure, featuring gate-defined target and sensor quantum dots. The sensor dot, integrated into an rf resonator circuit, enables the detection of single-electron charges in the target dots. Using this setup, we observe the rf-detected charge stability diagram indicating the formation of few-electron double quantum dots and provide the first benchmark of the bandwidth, sensitivity, and readout fidelity of rf reflectometry.
権利情報:
©2026 American Physical Society
キーワード: ZnO, Quantum dot, rf reflectometry
刊行年月日: 2026-07-21
出版者: American Physical Society (APS)
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.6421
公開URL: https://doi.org/10.1103/mnt5-s859
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更新時刻: 2026-07-23 15:36:32 +0900
MDRでの公開時刻: 2026-07-23 18:30:07 +0900
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manuscript.pdf
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application/pdf |
サイズ | 673KB | 詳細 |