ジャーナル論文 Charge sensing of few-electron ZnO double quantum dots probed by radio-frequency reflectometry
Kosuke Noro (author) (この著者で検索)
;
Motoya Shinozaki (author) (この著者で検索)
ORCID ; ORCID SAMURAI ;
Koichi Baba (author) (この著者で検索)
;
Kazuma Matsumura (author) (この著者で検索)
;
Yoshihiro Fujiwara (author) (この著者で検索)
;
Takeshi Kumasaka (author) (この著者で検索)
;
Atsushi Tsukazaki (author) (この著者で検索)
ORCID ;
Masashi Kawasaki (author) (この著者で検索)
;
Tomohiro Otsuka (author) (この著者で検索)
ORCID
コレクション

引用
Kosuke Noro, Motoya Shinozaki, Yusuke Kozuka, Koichi Baba, Kazuma Matsumura, Yoshihiro Fujiwara, Takeshi Kumasaka, Atsushi Tsukazaki, Masashi Kawasaki, Tomohiro Otsuka. Charge sensing of few-electron ZnO double quantum dots probed by radio-frequency reflectometry. Physical Review Applied. 2026, 26 (1), 014065. https://doi.org/10.1103/mnt5-s859

説明:

(abstract)

Zinc oxide (ZnO) has garnered much attention as a promising material for quantum devices due to its unique characteristics. To utilize the potential of ZnO for quantum devices, the development of fundamental technological elements such as high-speed readout and charge sensing capabilities has become essential. In this study, we address these challenges by demonstrating radio-frequency (rf) reflectometry and charge sensing in ZnO quantum dots, thus advancing the potential for qubit applications. A device is fabricated on a high-quality ZnO heterostructure, featuring gate-defined target and sensor quantum dots. The sensor dot, integrated into an rf resonator circuit, enables the detection of single-electron charges in the target dots. Using this setup, we observe the rf-detected charge stability diagram indicating the formation of few-electron double quantum dots and provide the first benchmark of the bandwidth, sensitivity, and readout fidelity of rf reflectometry.

権利情報:

キーワード: ZnO, Quantum dot, rf reflectometry

刊行年月日: 2026-07-21

出版者: American Physical Society (APS)

掲載誌:

  • Physical Review Applied (ISSN: 23317019) vol. 26 issue. 1 014065

研究助成金:

  • The Ebara Hatakeyama Memorial Foundation Research Grant
  • FRiD Tohoku University
  • “Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM)” of the Ministry of Education, Culture, Sports, Science and Technology JPMXP1224NM5072
  • World Premier International Research Center Initiative (WPI), MEXT, Japan
  • RIEC Fundamental Technology Center
  • Laboratory for Nanoelectronics and Spintronics
  • MEXT Leading Initiative for Excellent Young Researchers, Grants-in-Aid for Scientific Research 21K18592
  • MEXT Leading Initiative for Excellent Young Researchers, Grants-in-Aid for Scientific Research 22H04958
  • MEXT Leading Initiative for Excellent Young Researchers, Grants-in-Aid for Scientific Research 23H01789
  • MEXT Leading Initiative for Excellent Young Researchers, Grants-in-Aid for Scientific Research 23H04490
  • MEXT Leading Initiative for Excellent Young Researchers, Grants-in-Aid for Scientific Research 25H01504
  • Tanigawa Foundation Research Grant, Maekawa Foundation Research Grant
  • The Foundation for Technology Promotion of Electronic Circuit Board
  • Iketani Science and Technology Foundation Research Grant

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.6421

公開URL: https://doi.org/10.1103/mnt5-s859

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更新時刻: 2026-07-23 15:36:32 +0900

MDRでの公開時刻: 2026-07-23 18:30:07 +0900

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