Degradation of encapsulated perovskite solar cells driven by deep trap states and interfacial deterioration

Dhruba B. Khadka; Yasuhiro Shirai; Masatoshi Yanagida; Kenjiro Miyano

doi:10.1039/c7tc03733c

論文 Degradation of encapsulated perovskite solar cells driven by deep trap states and interfacial deterioration

Dhruba B. Khadka (National Institute for Materials Science) ; Yasuhiro Shirai (National Institute for Materials Science) ; Masatoshi Yanagida (National Institute for Materials Science) ; Kenjiro Miyano (National Institute for Materials Science)

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引用

Dhruba B. Khadka, Yasuhiro Shirai, Masatoshi Yanagida, Kenjiro Miyano. Degradation of encapsulated perovskite solar cells driven by deep trap states and interfacial deterioration. Journal of Materials Chemistry C. 2017, 6 (1), 162-170. https://doi.org/10.1039/c7tc03733c

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(abstract)

The degradation of encapsulated perovskite devices has been investigated by optoelectronic
characterization.The degradation of device performance was found to be influenced by both interface recombination and deep trap assisted recombination in the perovskite. The analysis of temperature dependent current–voltage characteristics and capacitance spectra revealed that the decrease in the activation energy of interface recombination, deepening of the defect levels and reduction in the diffusion potential of devices led to deterioration of device parameters with aging. The degradation of the encapsulated device might be governed by dissociation and migration of constituentions which induce deeper defect levels in the perovskite layer and deteriorate the interface with aging.

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