論文 Unlocking the potential of battery technologies through time-of-Flight Secondary Ion Mass Spectrometry

Prince Sharma ORCID ; Gen Hasegawa SAMURAI ORCID ; Sihao Xing ; Naoaki Kuwata SAMURAI ORCID

コレクション

引用
Prince Sharma, Gen Hasegawa, Sihao Xing, Naoaki Kuwata. Unlocking the potential of battery technologies through time-of-Flight Secondary Ion Mass Spectrometry. Science and Technology of Advanced Materials. 2025, 26 (1), 2580917. https://doi.org/10.1080/14686996.2025.2580917

説明:

(abstract)

In response to the evolving demands in energy storage, the review underscores the critical need for ongoing research in battery technology, specifically centred to indispensable role of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) which aims to characterize the intricate components of all kind of batteries. This article extensively examines SIMS applications, illuminating aspects such as chemical compositions, structural arrangements, electronic behaviours, and various parameters like bulk and grain diffusion coefficients. All these effective parameters analysis extends to the discussion of in-situ studies, suggesting the potential for operando SIMS and emphasizing their vital role in real-time monitoring during battery operations. These studies unveil intricate interactions at solid-solid interfaces, exerting a significant influence on overall battery performance. By spotlighting recent advances and emerging trends, the review summarizes and examines case studies by various researchers on the use of SIMS for analysing battery-related materials.

権利情報:

キーワード: Battery, ToF-SIMS, Diffusion, Interface

刊行年月日: 2025-12-31

出版者: Informa UK Limited

掲載誌:

  • Science and Technology of Advanced Materials (ISSN: 14686996) vol. 26 issue. 1 2580917

研究助成金:

  • Japan Society for the Promotion of Science P24365

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1080/14686996.2025.2580917

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更新時刻: 2025-12-10 16:30:11 +0900

MDRでの公開時刻: 2025-12-10 16:25:17 +0900

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