説明:
(abstract)This study examines how many SEM-BSE images are needed for reliable phase-fraction analysis of a four-phase MoSiBTiC alloy. A machine-learning-assisted segmentation workflow achieved 98.4% pixel accuracy and reduced the processing time for 100 images from about 300 days to one working day. Bootstrap analysis showed that using only a few images can cause errors above 15%, especially for TiC. About 60 images at 2000× are needed to limit sampling uncertainty in fracture-toughness estimates to the level of experimental error.
権利情報:
キーワード: MoSiBTiC alloy, Scanning electron microscopy, Image segmentation, Machine learning, Bootstrap resampling, Fracture toughness
刊行年月日: 2026-07-30
出版者: Elsevier BV
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1016/j.jmrt.2026.07.282
関連資料:
その他の識別子:
連絡先:
更新時刻: 2026-09-16 10:47:16 +0900
MDRでの公開時刻: 2026-09-16 12:27:18 +0900
| ファイル名 | サイズ | |||
|---|---|---|---|---|
| ファイル名 |
1-s2.0-S2238785426020132-main.pdf
(サムネイル)
application/pdf |
サイズ | 8.5MB | 詳細 |