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説明:

Quantum computing has emerged as a promising technology for next-generation information processing, utilizing semiconductor quantum dots as one of the candidates for quantum bits. Radio-frequency (rf) reflectometry plays an important role in the readout of quantum dots but requires a precise rf measurement technique at cryogenic temperatures. While cryogenic calibration techniques, essential for rf reflectometry, have been developed, on-board calibration near the device remains an important challenge. In this study, we develop an on-board calibrated rf measurement system operating at 4 K for characterizing SrTiO3-based varactors, which are promising components for tunable impedance matching circuits. Our system enables accurate measurements by eliminating errors associated with long rf circuit lines. We investigate the effects of annealing conditions, crystal orientation, and Ca doping of SrTiO3 crystals on the varactor properties in the frequency range for rf reflectometry. Our results provide insights for optimizing these components for cryogenic rf applications in quantum information processing systems.

権利情報:

• In Copyright
  

  This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Akitomi Shirachi, Motoya Shinozaki, Yasuhide Tomioka, Hisashi Inoue, Kenta Itoh, Yusuke Kozuka, Takanobu Watanabe, Shoichi Sato, Takeshi Kumasaka, Tomohiro Otsuka; On-board calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties. Appl. Phys. Lett. 13 October 2025; 127 (15): 153501 and may be found at https://doi.org/10.1063/5.0299758

キーワード: SrTiO3, RF reflectometry

刊行年月日: 2025-10-13

出版者: AIP Publishing

掲載誌:

• Applied Physics Letters (ISSN: 00036951) vol. 127 issue. 15 153501

研究助成金:

• Japan Society for the Promotion of Science

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.5804

公開URL: https://doi.org/10.1063/5.0299758

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更新時刻: 2025-10-21 16:06:12 +0900

MDRでの公開時刻: 2025-10-21 15:43:23 +0900