# XAFS spectrum of Silicon https://mdr.nims.go.jp/datasets/8aa129b6-8c2c-42a6-ac61-24893890bdc2 ## Files - [19012411.dat](https://mdr.nims.go.jp/filesets/60c695d5-f608-4eeb-bcfd-fa01c3b9e1f7/download) ([Detail](https://mdr.nims.go.jp/filesets/60c695d5-f608-4eeb-bcfd-fa01c3b9e1f7.md)) - [19012411.pfy](https://mdr.nims.go.jp/filesets/a38d3a02-32d0-4a31-b10b-2578f1ac24ea/download) ([Detail](https://mdr.nims.go.jp/filesets/a38d3a02-32d0-4a31-b10b-2578f1ac24ea.md)) - [19012411.tey](https://mdr.nims.go.jp/filesets/86acfaf8-8536-4ea8-b9e6-7eaf436a3208/download) ([Detail](https://mdr.nims.go.jp/filesets/86acfaf8-8536-4ea8-b9e6-7eaf436a3208.md)) - [metadata.json](https://mdr.nims.go.jp/filesets/626b9676-13b9-4622-bb9a-e799267edd5a/download) ([Detail](https://mdr.nims.go.jp/filesets/626b9676-13b9-4622-bb9a-e799267edd5a.md)) - [metadata.yml](https://mdr.nims.go.jp/filesets/03d1e3ef-57ee-4a77-96d5-d48fd8b50f9f/download) ([Detail](https://mdr.nims.go.jp/filesets/03d1e3ef-57ee-4a77-96d5-d48fd8b50f9f.md)) - [primary.tsv](https://mdr.nims.go.jp/filesets/7421da19-5d81-431d-b71c-3220ce1a7b6e/download) ([Detail](https://mdr.nims.go.jp/filesets/7421da19-5d81-431d-b71c-3220ce1a7b6e.md)) - [BL10_Si-K_002_pfy.png](https://mdr.nims.go.jp/filesets/537d3a72-ffef-45f6-b05c-807bb17c2094/download) ([Detail](https://mdr.nims.go.jp/filesets/537d3a72-ffef-45f6-b05c-807bb17c2094.md)) - [BL10_Si-K_002_tey.png](https://mdr.nims.go.jp/filesets/9244542c-3e8d-48b6-9a24-8166e23772d7/download) ([Detail](https://mdr.nims.go.jp/filesets/9244542c-3e8d-48b6-9a24-8166e23772d7.md)) ## Id 8aa129b6-8c2c-42a6-ac61-24893890bdc2 ## Local identifier identifier: Ritsu_MDR_20220603/mdr-bp0004-0000044 ## Visibility open_to_public ## State published ## Created at 2022-03-28T11:22:24.771830Z ## Updated at 2025-05-02T12:52:42.839463Z ## Published at 2022-06-10T13:38:38.298987Z ## Doi https://doi.org/10.48505/nims.3326 ## First published url https://www.ritsumei.ac.jp/acd/re/src/sx_xafs_db/ ## Date published ## Recorded date published ## Resource type dataset ## Manuscript type na ## Collection - id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54 identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54 title: MDR XAFS DB ## Title - title: XAFS spectrum of Silicon title_type: original lang: en ## Description - description: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon measured at Ritsumeikan-SR BL-10, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR description_type: abstract lang: en ## Creator - name: Masashi Ishii role: editor orcid: https://orcid.org/0000-0003-0357-2832 organization: National Institute for Materials Science - name: Ritsumeikan SR Center role: author organization: Ritsumeikan University ror: https://ror.org/0197nmd03 ## Contact agent - name: Ritsumeikan SR Center organization: Ritsumeikan University ## Publisher organization: Ritsumeikan University ## Managing organization ## Keyword - subject: Silicon (wafer) schema: not_defined - subject: Si schema: not_defined - subject: Si K-edge schema: not_defined - subject: Pure metal schema: not_defined - subject: BL-10 schema: not_defined - subject: Ritsumeikan-SR schema: not_defined - subject: XAFS schema: not_defined - subject: collection - MDR XAFS DB schema: not_defined - subject: Silicon schema: not_defined - subject: Pure metalloid schema: not_defined ## Rights - description: Creative Commons BY Attribution 4.0 International identifier: https://creativecommons.org/licenses/by/4.0/ date_licensed: 2025-05-01 ## Other identifier(s) ## Data origin - data_origin_type: experiment ## Embargo ## Journal ## Conference ## Related item ## Funding ## Instrument - name: BL-10_XAFS description: Ritsumeikan SR Center Soft X-ray XAFS Beamline setup manufacturer: Ritsumeikan SR Center function_description: x-ray absorption spectroscopy ## Instrument operator ## Instrument managing organization - organization: Ritsumeikan University department: Ritsumeikan SR Center ror: '0197nmd03' ## Measurement method - category_vocabulary: http://matvoc.nims.go.jp/entity/Q386 category_description: x-ray absorption spectroscopy analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30 analysis_field_description: spectroscopy description: TEY measured_at: '2019-01-24T09:51:21Z' - category_vocabulary: http://matvoc.nims.go.jp/entity/Q386 category_description: x-ray absorption spectroscopy analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30 analysis_field_description: spectroscopy description: PFY measured_at: '2019-01-24T09:51:21Z' ## Specimen - name: Silicon description: wafer, 0.38 mmt, n-type, (100) plane, on carbon tape material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q5244 material_type_description: Pure metalloid ## Chemical composition - identifier: 7440-21-3 category_vocabulary: http://matvoc.nims.go.jp/entity/Q2366 ## Structure for specimen ## Structural feature for specimen - category_vocabulary: http://matvoc.nims.go.jp/entity/Q686 category_description: local structure description: Geometrical and electronic local structure around the absorption element ## Specific property for specimen ## Process for specimen treatment ## Computational method ## Energy level/transition state - category_vocabulary: http://matvoc.nims.go.jp/entity/Q2501 description: Si K-edge ## Software ## Custom property ## Fileset - id: 60c695d5-f608-4eeb-bcfd-fa01c3b9e1f7 filename: 19012411.dat content_type: application/octet-stream size: 30088 md5: 28061af11743fb27a80737cdcf6f3dbd - id: a38d3a02-32d0-4a31-b10b-2578f1ac24ea filename: 19012411.pfy content_type: application/octet-stream size: 5134 md5: f893ea28705902f2b62eafbd28aa6b6e - id: 86acfaf8-8536-4ea8-b9e6-7eaf436a3208 filename: 19012411.tey content_type: application/octet-stream size: 5136 md5: 7516c48bec77895ad928665d29e40830 - id: 626b9676-13b9-4622-bb9a-e799267edd5a filename: metadata.json content_type: application/json size: 15591 md5: aec6573433fc7bdd7f7e44cfeb80660d - id: 03d1e3ef-57ee-4a77-96d5-d48fd8b50f9f filename: metadata.yml content_type: application/octet-stream size: 8163 md5: e6350b8cdd9f9ddec45f9bbb3f140970 - id: 7421da19-5d81-431d-b71c-3220ce1a7b6e filename: primary.tsv content_type: text/tab-separated-values size: 14632 md5: 1e0725f2c0452faa38aee1b82ca1d0fe - id: 537d3a72-ffef-45f6-b05c-807bb17c2094 filename: BL10_Si-K_002_pfy.png content_type: image/png size: 21225 md5: 04b9b3bad51a8cea89e3b58b55d86c48 - id: 9244542c-3e8d-48b6-9a24-8166e23772d7 filename: BL10_Si-K_002_tey.png content_type: image/png size: 22211 md5: e3bfbfb9297136bb0d476383ed77c915 ## Thumbnail fileset_id: 9244542c-3e8d-48b6-9a24-8166e23772d7 filename: BL10_Si-K_002_tey.png