Download file (2.12MB)
Download as zip (2.05MB)

コレクション

引用

説明:

We developed and implemented a fully automated method to perform X-ray photoelectron spectroscopy (XPS) spectral analysis based on the active Shirley method and information criteria. Our method searches a large number of initial fitting models by changing the degree of smoothing, and then optimizes the peak parameters and background parameters to obtain a large number of fitting results. The goodness of those optimized models is ranked using information criteria. As a result of applying this algorithm to measured XPS spectra, we found that, using the Bayesian information criterion (BIC), a simple model with reasonably good agreement and a moderate number of peaks was selected. The model selected by the BIC was close to the result of peak fitting performed by XPS analysis experts.

権利情報:

• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

  Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International

キーワード: Active Shirley method, Akaike information criterion (AIC), Bayesian information criterion (BIC), X-ray photoelectron spectroscopy (XPS)

刊行年月日: 2019-12-03

出版者:

掲載誌:

• Journal of Electron Spectroscopy and Related Phenomena

研究助成金:

原稿種別: 論文以外のデータ

MDR DOI: https://doi.org/10.48505/nims.3459

公開URL: https://doi.org/10.1016/j.elspec.2019.146903

関連資料:

その他の識別子:

連絡先:

更新時刻: 2024-01-05 22:12:40 +0900

MDRでの公開時刻: 2022-06-24 19:24:47 +0900