# Evaluation of dielectric function models for calculation of electron inelastic mean free path

https://mdr.nims.go.jp/datasets/894ed7d8-71ac-4242-9e39-da79dbf837c2

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## Id

894ed7d8-71ac-4242-9e39-da79dbf837c2

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2023-03-30T08:15:03.830427Z

## Updated at

2024-01-05T13:12:40.780584Z

## Published at

2023-04-11T01:32:13.835586Z

## Doi

https://doi.org/10.48505/nims.3952

## First published url

https://doi.org/10.1063/5.0085984

## Date published

2022-05-07

## Recorded date published

2022-5-7

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Evaluation of dielectric function models for calculation of electron inelastic
    mean free path
  title_type: original
  lang: en

## Description

- description: This work investigates the detailed difference between dielectric function
    models, the Mermin model and the full Penn algorithm (FPA) model, for the determination
    of an electron inelastic mean free path (IMFP) with optical energy loss function
    (ELF), as an extension of our previous study [Da et al., Surf. Interface Anal.
    51, 627 (2019)] by using the simple Drude-type ELF. In the conventional normal
    Mermin (NM) model, the approximations of ELF by the Drude equation will introduce
    inevitable fitting error. In order to enhance the accuracy of the NM model, our
    previous proposed extended Mermin model [Da et al., Phys. Rev. Lett. 113, 063201
    (2014)], which is renamed as a super-extended Mermin algorithm (SE-MA) now, is
    employed to eliminate the error by expanding the definition of Drude oscillators
    used in the NM. In the SE-MA, the Drude-like oscillators allow the existence of
    negative strengths to express the fine structures of phonon–electron scattering
    and the plasmon lifetime broadening effect. Because in our previous study, the
    simple Drude-type ELF cannot include these complex structures, in this work, the
    electron IMFPs are calculated for five realistic materials, Al, Si, Cu, Au, and
    MgO. The difference between IMFPs calculated by the SE-MA model and the FPA model
    is material dependent and is significant in the low energy region, which is analyzed
    by using the Fano plot. This is due to the more important role played by the plasmon
    lifetime broadening effect.
  description_type: abstract
  lang: eng

## Creator

- name: B. Da
  role: author
  orcid: https://orcid.org/0000-0002-0785-8662
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: X. Liu
  role: author
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: L. H. Yang
  role: author
- name: J. M. Gong
  role: author
- name: Z. J. Ding
  role: author
- name: H. Shinotsuka
  role: author
  orcid: https://orcid.org/0000-0001-5147-1396
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: J. W. Liu
  role: author
  orcid: https://orcid.org/0000-0003-2580-7401
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: H. Yoshikawa
  role: author
  orcid: https://orcid.org/0000-0002-7389-8865
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: S. Tanuma
  role: author
  orcid: https://orcid.org/0000-0003-2628-9941
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26

## Contact agent



## Publisher

organization: AIP Publishing

## Managing organization



## Keyword

- subject: electron inelastic mean free path
  schema: not_defined
- subject: Mermin model
  schema: not_defined
- subject: plasmon lifetime
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin



## Embargo



## Journal

- title: JOURNAL OF APPLIED PHYSICS
  issn: '00218979'
  volume: '131'
  issue: '17'
  start_page: 175301
  end_page: 175301

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## Fileset

- id: b46eaa69-41d0-46ad-ad43-12deea6131e9
  filename: clear copy-Evaluation of dielectric  function models for calculation of
    electron inelastic mean free  path.docx
  content_type: application/vnd.openxmlformats-officedocument.wordprocessingml.document
  size: 19911450
  md5: 212ffaa62abf07976244750a79a7e1d1

## Thumbnail

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filename: clear copy-Evaluation of dielectric  function models for calculation of
  electron inelastic mean free  path.docx