# Identification of the monolayer thickness difference in a mechanically exfoliated thick flake of hexagonal boron nitride and graphite for van der Waals heterostructures

https://mdr.nims.go.jp/datasets/865db048-5b2e-43d5-9338-7dda8e2c5a73

## File

- [Hattori_2023_Nanotechnology_34_295701.pdf](https://mdr.nims.go.jp/filesets/d9b2b553-7dd5-4b5c-89c5-ba0df25e75f8/download) ([Detail](https://mdr.nims.go.jp/filesets/d9b2b553-7dd5-4b5c-89c5-ba0df25e75f8.md))

## Id

865db048-5b2e-43d5-9338-7dda8e2c5a73

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-02-14T07:15:02.114588Z

## Updated at

2025-02-15T03:30:44.888100Z

## Published at

2025-02-15T03:30:44.991024Z

## Doi



## First published url

https://doi.org/10.1088/1361-6528/accf23

## Date published

2023-07-16

## Recorded date published

2023-7-16

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Identification of the monolayer thickness difference in a mechanically exfoliated
    thick flake of hexagonal boron nitride and graphite for van der Waals heterostructures
  title_type: original
  lang: en

## Description

- description: 'Exfoliated flakes of layered materials, such as hexagonal boron nitride
    (hBN) and graphite with a thickness of several tens of nanometers, are used to
    construct van der Waals heterostructures. A flake with a desirable thickness,
    size, and shape is often selected from many exfoliated flakes placed randomly
    on a substrate using an optical microscope. This study examined the visualization
    of thick hBN and graphite flakes on SiO2/Si substrates through calculations and
    experiments. In particular, the study analyzed areas with different atomic layer
    thicknesses in a flake. For visualization, the SiO2 thickness was optimized based
    on the calculation. As an experimental result, the area with different thicknesses
    in a hBN flake showed different brightness in the image obtained using an optical
    microscope with a narrow band-pass filter. The maximum contrast was 12% with respect
    to the difference of one atomic layer thickness. In addition, hBN and graphite
    flakes were observed by differential interference contrast (DIC) microscopy. In
    the observation, the area with different thicknesses exhibited different brightnesses
    and colors. Adjusting the DIC bias had a similar effect to selecting a wavelength
    using a narrow band-pass filter. '
  description_type: abstract
  lang: und

## Creator

- name: Yoshiaki Hattori
  role: author
- name: Takashi Taniguchi
  role: author
  orcid: https://orcid.org/0000-0002-1467-3105
  organization: National Institute for Materials Science
- name: Kenji Watanabe
  role: author
  orcid: https://orcid.org/0000-0003-3701-8119
  organization: National Institute for Materials Science
- name: Masatoshi Kitamura
  role: author

## Contact agent



## Publisher

organization: IOP Publishing

## Managing organization



## Keyword

- subject: Hexagonal boron nitride
  schema: not_defined
- subject: van der Waals heterostructures
  schema: not_defined
- subject: optical microscope
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Nanotechnology
  issn: '13616528'
  volume: '34'
  issue: '29'
  article_number: '295701'

## Conference



## Related item



## Funding

- funder_name: Chubei Itoh Foundation
- funder_name: Kansai Research Foundation
- identifier: 21H04655
  funder_name: Japan Society for the Promotion of Science
- funder_name: Hyogo Science and Technology Association
- funder_name: Iketani Science and Technology Foundation

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



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## Custom property



## Fileset

- id: d9b2b553-7dd5-4b5c-89c5-ba0df25e75f8
  filename: Hattori_2023_Nanotechnology_34_295701.pdf
  content_type: application/pdf
  size: 3028285
  md5: b1871d533d8742418c5cef062448e51a

## Thumbnail

fileset_id: d9b2b553-7dd5-4b5c-89c5-ba0df25e75f8
filename: Hattori_2023_Nanotechnology_34_295701.pdf