# Fourier Transform Thermoreflectance Method Under Front-Heat Front-Detect Configuration

https://mdr.nims.go.jp/datasets/7ea5fca7-2803-4956-a87c-f473ac9770c1

## File

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## Id

7ea5fca7-2803-4956-a87c-f473ac9770c1

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-03-27T13:46:11.652654Z

## Updated at

2024-07-31T23:30:19.194731Z

## Published at

2024-07-31T23:30:19.283393Z

## Doi



## First published url

https://doi.org/10.1007/s10765-024-03351-1

## Date published

2024-03-25

## Recorded date published

2024-5

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Fourier Transform Thermoreflectance Method Under Front-Heat Front-Detect
    Configuration
  title_type: original
  lang: en

## Description

- description: The themoreflectance method, which can measure thermal diffusivity
    in the cross-plane direction of thin films, mainly has two possible configurations;
    rear-heat front-detect (RF) and front-heat front-detect (FF) configuration. FF
    configuration is applicable to a wide variety of thin films including thin films
    deposited on opaque substrates, but this configuration has some problems in determination
    of the thermal diffusivity. One of the main problems is the effect of the penetration
    of pump beam and probe beam in thin film, which affects the initial temperature
    distribution near the sample’s surface after pulse heating. Several studies have
    tried to analyze the effect but there have been no practical analytical solutions
    which can solve this problem in FF configuration. In this paper, we propose a
    new analytical solution which considers the penetration of pump beam and probe
    beam into thin film, and by applying Fourier expansion analysis which we developed
    in a previous study to thermoreflectance signals, we have determined the thermal
    diffusivity of thin film in the thermoreflectance method under FF configuration.
    We measured platinum thin films with different thickness under both FF and RF
    configuration and obtained consistent thermal diffusivity values from both configurations.
  description_type: abstract
  lang: und

## Creator

- name: Takahiro Baba
  role: author
- name: Tetsuya Baba
  role: author
  orcid: https://orcid.org/0000-0001-5820-3757
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Takao Mori
  role: author
  orcid: https://orcid.org/0000-0003-2682-1846
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26

## Contact agent



## Publisher

organization: Springer Science and Business Media LLC

## Managing organization



## Keyword

- subject: thermal conductivity
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: International Journal of Thermophysics
  issn: '0195928X'
  volume: '45'
  issue: '5'
  article_number: '61'

## Conference



## Related item



## Funding

- identifier: JPMJMI19A1
  funder_name: JST-Mirai Program
- identifier: JPMJMI19A1
  funder_name: JST-Mirai Program
- identifier: JPMJMI19A1
  funder_name: JST-Mirai Program
- identifier: JPMJSP2124
  funder_name: Japan Society for the Promotion of Science
- identifier: JPMJSP2124
  funder_name: Japan Society for the Promotion of Science

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## Specimen



## Chemical composition



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## Fileset

- id: 32335ff9-e722-4a0a-9ecf-3bd9c95a3e25
  filename: s10765-024-03351-1.pdf
  content_type: application/pdf
  size: 1649540
  md5: 1493080dc472ed0e9120f9183076d62e

## Thumbnail

fileset_id: 32335ff9-e722-4a0a-9ecf-3bd9c95a3e25
filename: s10765-024-03351-1.pdf