# Observation of the birefringent effect on grown GeS thin films

https://mdr.nims.go.jp/datasets/7dc8a4ca-4b47-4339-b334-8065935e6eca

## File

- [EDIT_abst-zmf.pdf](https://mdr.nims.go.jp/filesets/c7a77948-2f9e-4491-86b9-4fcaac15db3f/download) ([Detail](https://mdr.nims.go.jp/filesets/c7a77948-2f9e-4491-86b9-4fcaac15db3f.md))

## Id

7dc8a4ca-4b47-4339-b334-8065935e6eca

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-04-02T01:42:31.570356Z

## Updated at

2025-04-08T04:15:52.433425Z

## Published at

2025-04-07T13:19:36.945334Z

## Doi

https://doi.org/10.48505/nims.5405

## First published url

https://edit-ws.jp/program/

## Date published

2025-01-23

## Recorded date published



## Resource type

conference_paper

## Manuscript type

authors_original

## Collection



## Title

- title: Observation of the birefringent effect on grown GeS thin films
  title_type: original
  lang: en

## Description

- description: Two-dimensional layered semiconductors, i.e., germanium monosulfide
    (GeS), have been considered as one of the candidates for developing next-generation
    functional electronics and optoelectronics. Previously, lateral growth of GeS
    thin films using the pre-deposited amorphous GeS method and fabrication of GeS
    field-effect transistors (FETs) have been investigated. In this study, observation
    of the birefringent behavior in grown GeS thin films is demonstrated using the
    cross-polarizer of the optical microscope.
  description_type: abstract
  lang: en

## Creator

- name: Qinqiang Zhang
  role: author
  organization: NIMS
  department: MANA
- name: Ryo Matsumura
  role: author
  orcid: https://orcid.org/0000-0003-2303-4978
  organization: NIMS
  department: MANA
- name: Naoki Fukata
  role: author
  orcid: https://orcid.org/0000-0002-0986-8485
  organization: NIMS
  department: MANA

## Contact agent



## Publisher

organization: 電子デバイス界面テクノロジー研究会 –材料・プロセス・デバイス特性の物理–

## Managing organization



## Keyword

- subject: GeS
  schema: not_defined

## Rights

- identifier: http://rightsstatements.org/vocab/InC/1.0/

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## Data origin

- data_origin_type: other

## Embargo



## Journal



## Conference

name: 第30回電子デバイス界面テクノロジー研究会 ― 材料・プロセス・デバイス特性の物理 ― (EDIT 30)
start_date: 2025-01-22
end_date: 2025-01-24
identifier: https://edit-ws.jp/

## Related item



## Funding

- identifier: JP20K14796
  funder_name: JSPS
- identifier: JP23K13370
  funder_name: JSPS
- identifier: JP24KF0164
  funder_name: JSPS

## Instrument



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## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



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## Fileset

- id: c7a77948-2f9e-4491-86b9-4fcaac15db3f
  filename: EDIT_abst-zmf.pdf
  content_type: application/pdf
  size: 837933
  md5: 12424c9acc9b0bd6de72984d8b7f997c

## Thumbnail

fileset_id: c7a77948-2f9e-4491-86b9-4fcaac15db3f
filename: EDIT_abst-zmf.pdf