# XAFS spectrum of Tantalum(V) oxide

https://mdr.nims.go.jp/datasets/767e96df-caa1-411c-98c2-970661212a46

## File

- [metadata.all.json](https://mdr.nims.go.jp/filesets/760c2ce5-599e-4484-84d6-8bdc691d08e6/download) ([Detail](https://mdr.nims.go.jp/filesets/760c2ce5-599e-4484-84d6-8bdc691d08e6.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/d738f54d-add5-49a3-9434-0ac145766eed/download) ([Detail](https://mdr.nims.go.jp/filesets/d738f54d-add5-49a3-9434-0ac145766eed.md))
- [Ta-L1_Ta2O5_Si111_50ms_200617.txt](https://mdr.nims.go.jp/filesets/e9df87e7-82b0-427a-87d9-34a5175a74e6/download) ([Detail](https://mdr.nims.go.jp/filesets/e9df87e7-82b0-427a-87d9-34a5175a74e6.md))
- [Ta-L21_Ta2O5_Si111_50ms_200617.dat](https://mdr.nims.go.jp/filesets/93dbeb65-93d4-4352-94c2-4b1f60ec433f/download) ([Detail](https://mdr.nims.go.jp/filesets/93dbeb65-93d4-4352-94c2-4b1f60ec433f.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/3925db36-5722-469a-b342-7793e2a52159/download) ([Detail](https://mdr.nims.go.jp/filesets/3925db36-5722-469a-b342-7793e2a52159.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/2ca92f97-2218-4e36-a146-0dd9a36ddacc/download) ([Detail](https://mdr.nims.go.jp/filesets/2ca92f97-2218-4e36-a146-0dd9a36ddacc.md))
- [Ta2O5.thumb.png](https://mdr.nims.go.jp/filesets/440530e7-605b-462c-a4e1-0eafee0ef849/download) ([Detail](https://mdr.nims.go.jp/filesets/440530e7-605b-462c-a4e1-0eafee0ef849.md))
- [Ta-L1_Ta2O5_Si111_50ms_200617.ex3](https://mdr.nims.go.jp/filesets/8bfaa4bd-f8e7-4017-8290-5b334ed81048/download) ([Detail](https://mdr.nims.go.jp/filesets/8bfaa4bd-f8e7-4017-8290-5b334ed81048.md))

## Id

767e96df-caa1-411c-98c2-970661212a46

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:39:00.395586Z

## Updated at

2025-05-02T12:50:12.822806Z

## Published at

2021-08-12T16:08:39.917780Z

## Doi

https://doi.org/10.48505/nims.2865

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-24

## Recorded date published

24/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Tantalum(V) oxide
  title_type: original
  lang: en
- title: spring8.a706018f-7381-4496-be43-f1cfddedda00
  title_type: alternative
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Ta L21-edge of Tantalum(V) oxide measured at SPring-8 BL14B2, and is a part
    of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(111)
  schema: not_defined
- subject: Ta2O5
  schema: not_defined
- subject: Ta L21-edge
  schema: not_defined
- subject: Oxide
  schema: not_defined
- subject: Tantalum(V) oxide
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2020-06-17T01:35:00Z'

## Specimen

- name: Tantalum(V) oxide
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q735
  material_type_description: Oxide

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1711

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2722
  description: Ta L2-edge

## Software



## Custom property



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## Thumbnail

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filename: Ta2O5.thumb.png