# Time-of-Flight-type Photoelectron Emission Microscopy with a 10.9-eV Laser

https://mdr.nims.go.jp/datasets/75986ada-6ffe-4830-8c32-29651c5b00a1

## File

- [22_2024-005 (2).pdf](https://mdr.nims.go.jp/filesets/f8a92588-465c-4621-96bb-4737045ed644/download) ([Detail](https://mdr.nims.go.jp/filesets/f8a92588-465c-4621-96bb-4737045ed644.md))

## Id

75986ada-6ffe-4830-8c32-29651c5b00a1

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-08-09T07:15:45.558413Z

## Updated at

2024-08-30T03:30:26.204177Z

## Published at

2024-08-30T03:30:26.299492Z

## Doi



## First published url

https://doi.org/10.1380/ejssnt.2024-005

## Date published

2024-02-17

## Recorded date published

2024

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Time-of-Flight-type Photoelectron Emission Microscopy with a 10.9-eV Laser
  title_type: original
  lang: en

## Description

- description: We have developed a novel photoemission microscopy apparatus employing
    a vacuum ultraviolet laser. This setup combines photoemission electron microscopy
    (PEEM) with a time-of-flight detector, facilitating rapid visualization of electronic
    states in both real and momentum space. Achieving a spatial resolution of 70 nm,
    attributed to the PEEM lens system, we showcase the full band mapping of a Bi(111)
    single crystal film using angle-resolved photoemission spectroscopy within a short
    acquisition time.
  description_type: abstract
  lang: und

## Creator

- name: Shunsuke Tsuda
  role: author
  orcid: https://orcid.org/0000-0001-6209-8048
  organization: National Institute for Materials Science
- name: Koichiro Yaji
  role: author
  orcid: https://orcid.org/0000-0002-0721-1316
  organization: National Institute for Materials Science

## Contact agent



## Publisher

organization: Surface Science Society Japan

## Managing organization



## Keyword

- subject: Photoemission spectroscopy
  schema: not_defined
- subject: " Momentum microscope"
  schema: not_defined
- subject: Electronic property
  schema: not_defined
- subject: Time of flight
  schema: not_defined
- subject: Ultraviolet laser
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin



## Embargo



## Journal

- title: e-Journal of Surface Science and Nanotechnology
  issn: '13480391'
  volume: '22'
  issue: '2'
  start_page: 170
  end_page: 173
  article_number: 2024-005

## Conference



## Related item



## Funding

- identifier: JP21K04633
  funder_name: JSPS
- identifier: JP22H01761
  funder_name: JSPS
- funder_name: Iketani Science and Technology Foundation
- identifier: JPJ004596
  funder_name: ALTA

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: f8a92588-465c-4621-96bb-4737045ed644
  filename: 22_2024-005 (2).pdf
  content_type: application/pdf
  size: 1299588
  md5: 4f78ef92b21647d83e3b9e4202220242

## Thumbnail

fileset_id: f8a92588-465c-4621-96bb-4737045ed644
filename: 22_2024-005 (2).pdf