# Insights into Accelerated Degradation of Perovskite Solar Cells under Continuous Illumination Driven by Thermal Stress and Interfacial Junction

https://mdr.nims.go.jp/datasets/7282465f-737b-449a-9598-dd927d74a003

## File

- [ACS_AEM-Submiited-Man.pdf](https://mdr.nims.go.jp/filesets/b68816c2-8ed3-4755-a466-26488d2ffad8/download) ([Detail](https://mdr.nims.go.jp/filesets/b68816c2-8ed3-4755-a466-26488d2ffad8.md))

## Id

7282465f-737b-449a-9598-dd927d74a003

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-11-27T00:53:50.286172Z

## Updated at

2024-11-29T07:31:03.850521Z

## Published at

2024-11-29T07:31:04.032842Z

## Doi

https://doi.org/10.48505/nims.5049

## First published url

https://doi.org/10.1021/acsaem.1c02037

## Date published

2021-10-25

## Recorded date published

2021-10-25

## Resource type

journal_article

## Manuscript type

authors_original

## Collection



## Title

- title: Insights into Accelerated Degradation of Perovskite Solar Cells under Continuous
    Illumination Driven by Thermal Stress and Interfacial Junction
  title_type: original
  lang: en

## Description

- description: The operational stability of encapsulated halide perovskite solar cells
    (HaPSCs) is imperative for their commercialization. Despite improvements in device
    stability, we lack insights into the irreversible degradation of devices under
    prolonged illumination and heat stress. Here, we investigated the operational
    stability of devices (∼1 cm2) made with poly(triaryl amine) (PTAA; power conversion
    efficiency PCE ≈ 19.32%) and sputtered NiOx (PCE ≈ 15.60%) as a hole-transport
    layer (HTL) under light (for >1000 h) at 20, 60, and 85 °C to unravel the degradation
    mechanisms. Degradation of the PTAA device was accelerated by interface deterioration
    and bulk decomposition initiated by the formation of voids and PbI2 via iodine
    migration from defective regions at the columnar grain boundaries with the release
    of I2 gas. The NiOx device, with its immunity to iodine and its moisture-resistive
    properties, had significantly improved stability with suppression of the HaP bulk
    degradation by alleviation of internal defect dynamics. Our results corroborate
    that the formation of voids and PbI2 crystallites at columnar intergrains or at
    the HTL (ETL) /HaP interface with the release of I2 gas is the primary cause of
    device degradation. Capacitance–voltage analysis showed that the PTAA device develops
    a much wider defective interface layer than the NiOx device, driven mainly by
    the chemical reaction of iodine with the interfacial layer. Thus, our results
    reveal that although the cracking of columnar intergrains and defective spots
    in the perovskite bulk is the main origin of device degradation, the nature of
    the carrier transport layer also partly contributes to catalyzing bulk and interface
    degradation. Thus, the passivation of columnar intergrain defects in the HaP bulk
    and lamination of the interface with a chemically inert to iodine and a moisture-resistive
    carrier-selective layer is crucial to the operational stability of HaPSCs.
  description_type: abstract
  lang: und

## Creator

- name: Dhruba B. Khadka
  role: author
  orcid: https://orcid.org/0000-0001-9134-3890
  organization: National Institute for Materials Science
- name: Yasuhiro Shirai
  role: author
  orcid: https://orcid.org/0000-0003-2164-5468
  organization: National Institute for Materials Science
- name: Masatoshi Yanagida
  role: author
  orcid: https://orcid.org/0000-0002-8065-7875
  organization: National Institute for Materials Science
- name: Kenjiro Miyano
  role: author
  orcid: https://orcid.org/0000-0002-5869-3087
  organization: National Institute for Materials Science

## Contact agent



## Publisher

organization: American Chemical Society (ACS)

## Managing organization



## Keyword

- subject: Device stability
  schema: not_defined
- subject: Iodine migration
  schema: not_defined
- subject: Nickel oxide
  schema: not_defined
- subject: Interfacial deterioration
  schema: not_defined
- subject: columnar inter-grains
  schema: not_defined
- subject: Capacitance spectroscopy,
  schema: not_defined
- subject: Perovskite degradation
  schema: not_defined

## Rights

- description: This document is the unedited Author’s version of a Submitted Work
    that was subsequently accepted for publication in ACS Applied Energy Materials,
    copyright ©  2021 American Chemical Society after peer review. To access the final
    edited and published work see https://doi.org/10.1021/acsaem.1c02037.
  identifier: http://rightsstatements.org/vocab/InC/1.0/

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## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: ACS Applied Energy Materials
  issn: '25740962'
  volume: '4'
  issue: '10'
  start_page: 11121
  end_page: 11132

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## Funding

- funder_name: Yazaki Memorial Foundation for Science and Technology

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