# Defect Engineering of Bi<sub>2</sub>SeO<sub>2</sub> Thermoelectrics

https://mdr.nims.go.jp/datasets/68364e10-199b-49de-9751-f05c07b3ef3e

## File

- [MDI-AFM-Defect Engineering of n-Type Bi2SeO2 Thermoelectrics1.pdf](https://mdr.nims.go.jp/filesets/c49df323-c36a-48ac-a600-33e951dffd85/download) ([Detail](https://mdr.nims.go.jp/filesets/c49df323-c36a-48ac-a600-33e951dffd85.md))

## Id

68364e10-199b-49de-9751-f05c07b3ef3e

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-11-08T15:30:33.927760Z

## Updated at

2025-11-11T02:26:52.026976Z

## Published at

2026-01-02T08:31:04.937510Z

## Doi

https://doi.org/10.48505/nims.5888

## First published url

https://doi.org/10.1002/adfm.202416509

## Date published

2024-12-29

## Recorded date published

2025-3

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Defect Engineering of Bi<sub>2</sub>SeO<sub>2</sub> Thermoelectrics
  title_type: original
  lang: en

## Description

- description: "Bi2SeO2 is a promising n-type semiconductor to pair with p-type BiCuSeO
    in a thermoelectric (TE) device. The TE figure of merit zT and, therefore, the
    device efficiency must be optimized by tuning the carrier concentration. However,
    electron concentrations in self-doped n-type Bi2SeO2 span several orders of magnitude,
    even in samples with same nominal compositions. Such unsystematic variations in
    the electron concentration has a thermodynamic origin related to the variations
    in native defect concentrations.\r\nIn this study, we use first-principles calculations
    to show that the selenium vacancy, which is the source of n-type conductivity
    in Bi2SeO2, varies by 1–2 orders of magnitude depending on the thermodynamic conditions.
    We predict that the electron concentration can be enhanced by synthesizing under
    more Se-poor conditions and/or at higher temperatures (TSSR), which promote the
    formation of selenium vacancies without introducing extrinsic dopants. We validate
    our computational predictions through solid-state synthesis of Bi2SeO2. We observe
    more than two orders of magnitude increase in the electron concentration by solely\r\nadjusting
    the synthesis conditions. Additionally, we reveal the significant effect of grain
    boundary scattering on electron transport in Bi2SeO2, which is controlled by adjusting
    TSSR. By simultaneously optimizing the electron concentration and mobility, we
    achieve a zT of ∼0.2 at 773 K for self-doped n-type Bi2SeO2. Our study highlights
    the need for careful control of thermodynamic growth conditions and demonstrates
    TE performance improvement by varying synthesis parameters."
  description_type: abstract
  lang: und

## Creator

- name: Andrei Novitskii
  role: author
  orcid: https://orcid.org/0000-0002-7304-806X
  organization: National Institute for Materials Science
- name: Michael Y. Toriyama
  role: author
- name: Illia Serhiienko
  role: author
  orcid: https://orcid.org/0000-0002-3072-9412
  organization: National Institute for Materials Science
- name: Takao Mori
  role: author
  orcid: https://orcid.org/0000-0003-2682-1846
  organization: National Institute for Materials Science
- name: G. Jeffrey Snyder
  role: author
- name: Prashun Gorai
  role: author

## Contact agent



## Publisher

organization: Wiley

## Managing organization



## Keyword

- subject: thermoelectric
  schema: not_defined

## Rights

- description: " This is the peer reviewed version of the following article: Andrei
    Novitskii, Michael Y. Toriyama, Illia Serhiienko, Takao Mori, G. Jeffrey Snyder,
    Prashun Gorai. Defect Engineering of Bi2SeO2 Thermoelectrics. Advanced Functional
    Materials. 2024, 35 (10), 2416509, which has been published in final form at https://doi.org/10.1002/adfm.202416509.
    This article may be used for non-commercial purposes in accordance with Wiley
    Terms and Conditions for Use of Self-Archived Versions. This article may not be
    enhanced, enriched or otherwise transformed into a derivative work, without express
    permission from Wiley or by statutory rights under applicable legislation. Copyright
    notices must not be removed, obscured or modified. The article must be linked
    to Wiley’s version of record on Wiley Online Library and any embedding, framing
    or otherwise making available the article or pages thereof by third parties from
    platforms, services and websites other than Wiley Online Library must be prohibited."
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo

start_date: 2024-12-29
end_date: 2025-12-29

## Journal

- title: Advanced Functional Materials
  issn: '16163028'
  volume: '35'
  issue: '10'
  article_number: '2416509'

## Conference



## Related item



## Funding

- identifier: JPMJMI19A1
  funder_name: Japan Science and Technology Agency
- identifier: JPMJMI19A1
  funder_name: Japan Science and Technology Agency
- identifier: JPMJMI19A1
  funder_name: Japan Science and Technology Agency
- identifier: JPMJSP2124
  funder_name: Japan Science and Technology Agency
- identifier: JPMJSP2124
  funder_name: Japan Science and Technology Agency
- identifier: JPMJSP2124
  funder_name: Japan Science and Technology Agency
- identifier: DE‐SC0020347
  funder_name: Office of Science
- identifier: 70NANB19H005
  funder_name: Center for Hierarchical Materials Design
- identifier: 70NANB19H005
  funder_name: Center for Hierarchical Materials Design
- identifier: DMR‐2102409
  funder_name: Division of Materials Research

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## Fileset

- id: c49df323-c36a-48ac-a600-33e951dffd85
  filename: MDI-AFM-Defect Engineering of n-Type Bi2SeO2 Thermoelectrics1.pdf
  content_type: application/pdf
  size: 4101336
  md5: e85b4419299a0503bce439f4629154ff

## Thumbnail

fileset_id: c49df323-c36a-48ac-a600-33e951dffd85
filename: MDI-AFM-Defect Engineering of n-Type Bi2SeO2 Thermoelectrics1.pdf