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説明:

Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2p -Fe 3d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only bulk band but also buried interface band of heterojunctions.

権利情報:

• Creative Commons BY Attribution 4.0 International
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キーワード: hard X-ray angle-resolved photoemission spectroscopy, X-ray total reflection, MgO/Fe interface, buried interface band dispersion

刊行年月日: 2024-07-01

出版者: IOP Publishing

掲載誌:

• Applied Physics Express (ISSN: 18820778) vol. 17 issue. 7 075501

研究助成金:

• MEXT JPMXP0112101001
• MEXT JPMXP1122683430

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.35848/1882-0786/ad5e33

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更新時刻: 2024-07-31 08:30:21 +0900

MDRでの公開時刻: 2024-07-31 08:30:21 +0900