# Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

https://mdr.nims.go.jp/datasets/61140d8f-96ba-49f9-9ed2-c3f411465a6c

## File

- [Tajiri_JSynchrotronRad_32_2025_125-132.pdf](https://mdr.nims.go.jp/filesets/1850b5bf-e4c2-4f1e-9733-4297abba12b2/download) ([Detail](https://mdr.nims.go.jp/filesets/1850b5bf-e4c2-4f1e-9733-4297abba12b2.md))

## Id

61140d8f-96ba-49f9-9ed2-c3f411465a6c

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-12-25T07:55:50.212714Z

## Updated at

2024-12-26T07:30:51.616304Z

## Published at

2024-12-26T07:30:51.690958Z

## Doi



## First published url

https://doi.org/10.1107/s1600577524011366

## Date published

2025-01-01

## Recorded date published



## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Diffractometer for element-specific analysis on local structures using a
    combination of X-ray fluorescence holography and anomalous X-ray scattering
  title_type: original
  lang: en

## Description

- description: To tackle disorder in crystals and short- and intermediate-range order
    in amorphous materials, such as a glass, we developed a carry-in diffractometer
    to utilize X-ray fluorescence holography (XFH) and anomalous X-ray scattering
    (AXS), facilitating element specific-analyses with atomic resolution using the
    wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies
    XFH and AXS configurations to determine the crystal orientation via diffractometry.
    In particular, XFH was realised even for a crystal with blurred emission lines
    by a standing wave in a hologram, and high-throughput AXS with sufficient count
    statistics and energy resolution was achieved using three multi-array detectors
    with crystal analysers. These features increase tractable targets by XFH and AXS,
    which have novel functionalities.
  description_type: abstract
  lang: und

## Creator

- name: Hiroo Tajiri
  role: author
  orcid: https://orcid.org/0000-0002-8457-5631
- name: Shinji Kohara
  role: author
  orcid: https://orcid.org/0000-0001-9596-2680
- name: Koji Kimura
  role: author
  orcid: https://orcid.org/0000-0001-5485-3672
- name: Sekhar Halubai
  role: author
- name: Haruto Morimoto
  role: author
- name: Naohisa Happo
  role: author
  orcid: https://orcid.org/0000-0003-1888-6762
- name: Jens R. Stellhorn
  role: author
  orcid: https://orcid.org/0000-0002-5579-6902
- name: Yohei Onodera
  role: author
  orcid: https://orcid.org/0000-0002-3080-6991
- name: Xvsheng Qiao
  role: author
  orcid: https://orcid.org/0000-0002-6411-1274
- name: Daisuke Urushihara
  role: author
  orcid: https://orcid.org/0000-0002-2967-0337
- name: Peidong Hu
  role: author
- name: Toru Wakihara
  role: author
  orcid: https://orcid.org/0000-0002-3916-3849
- name: Toyohiko Kinoshita
  role: author
  orcid: https://orcid.org/0000-0002-8030-0796
- name: Koichi Hayashi
  role: author
  orcid: https://orcid.org/0000-0002-8782-4293

## Contact agent



## Publisher

organization: International Union of Crystallography (IUCr)

## Managing organization



## Keyword

- subject: X-ray diffractometers
  schema: not_defined
- subject: element-specific measurements
  schema: not_defined
- subject: " X-ray fluorescence holography"
  schema: not_defined
- subject: anomalous X-ray scattering
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin



## Embargo



## Journal

- title: Journal of Synchrotron Radiation
  issn: '16005775'
  volume: '32'
  issue: '1'
  start_page: 125
  end_page: 132

## Conference



## Related item



## Funding

- identifier: 20H05878
  funder_name: Japan Society for the Promotion of Science
- identifier: 20H05880
  funder_name: Japan Society for the Promotion of Science
- identifier: 20H05881
  funder_name: Japan Society for the Promotion of Science

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 1850b5bf-e4c2-4f1e-9733-4297abba12b2
  filename: Tajiri_JSynchrotronRad_32_2025_125-132.pdf
  content_type: application/pdf
  size: 1380635
  md5: b693b6ff6340297fd0be35fd0f37dbc1

## Thumbnail

fileset_id: 1850b5bf-e4c2-4f1e-9733-4297abba12b2
filename: Tajiri_JSynchrotronRad_32_2025_125-132.pdf