@misc{yi-te2024a,
  title = {Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors},
  author = {Yi-Te Lee, Yu-Ting Huang, Shao-Pin Chiu, Ruey-Tay Wang, Takashi Taniguchi, Kenji Watanabe, Raman Sankar, Chi-Te Liang, Wei-Hua Wang, Sheng-Shiuan Yeh, Juhn-Jong Lin},
  publisher = {American Chemical Society (ACS)},
  year = {2024-01-10},
  keywords = {electron scattering, 2D materials, Coulomb scattering strength, low-frequency noise, indium selenide, interfacial Coulomb scatterers, 2D transist}
}