# Probing thickness-dependent tip-induced band bending in MoS2

https://mdr.nims.go.jp/datasets/5a57fa8a-1c74-442d-830e-9728897e5f75

## File

- [2025A00469G_Thickness+dependent+TIBB+_250224 clean.docx](https://mdr.nims.go.jp/filesets/253185c1-1e87-4178-aceb-7aa6488bd65e/download) ([Detail](https://mdr.nims.go.jp/filesets/253185c1-1e87-4178-aceb-7aa6488bd65e.md))

## Id

5a57fa8a-1c74-442d-830e-9728897e5f75

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-07-02T02:38:47.869437Z

## Updated at

2026-07-06T01:34:11.178968Z

## Published at

2026-07-06T03:30:04.262372Z

## Doi



## First published url

https://doi.org/10.1063/5.0252812

## Date published

2025-03-01

## Recorded date published

2025-3-1

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Probing thickness-dependent tip-induced band bending in MoS2
  title_type: original
  lang: en

## Description

- description: Scanning tunneling spectroscopy (STS) has played an important role
    in determining the electronic band structures of semiconductors. However, the
    tip-induced band bending (TIBB) could strongly affect the measured valence and
    conduction band edges, which are of vital importance for a semiconductor. In the
    literature, the presence or absence of the TIBB effect in a given STS measurement
    is often not discussed thoroughly. In this work, we quantitatively investigate
    the TIBB effect in MoS2 with varying thicknesses using light-modulated contact-mode
    STS. Our results demonstrate that the TIBB effect is strongly dependent on the
    thickness of MoS2. With thin MoS2 of a few atomic layers (several nanometers),
    the TIBB approaches zero, and the measured STS can accurately reflect the band
    edges. While for thicker MoS2 of ∼100 nm, the TIBB can be as large as ∼1 eV. This
    work clarifies the ambiguity about the TIBB effect and provides a foundation for
    the interpretation of STS data on atomically thin semiconductors.
  description_type: abstract
  lang: en

## Creator

- name: Jian Liao
  role: author
- name: Takashi Taniguchi
  role: author
  orcid: https://orcid.org/0000-0002-1467-3105
  organization: National Institute for Materials Science
- name: Kenji Watanabe
  role: author
  orcid: https://orcid.org/0000-0003-3701-8119
  organization: National Institute for Materials Science
- name: Jiamin Xue
  role: author

## Contact agent



## Publisher

organization: AIP Publishing

## Managing organization



## Keyword

- subject: Scanning tunneling spectroscopy (STS)
  schema: not_defined
- subject: Tip-induced band bending (TIBB)
  schema: not_defined
- subject: MoS2
  schema: not_defined

## Rights

- description: 'This article may be downloaded for personal use only. Any other use
    requires prior permission of the author and AIP Publishing. This article appeared
    in Jian Liao, Takashi Taniguchi, Kenji Watanabe, Jiamin Xue; Probing thickness-dependent
    tip-induced band bending in MoS2. Appl. Phys. Lett. 17 March 2025; 126 (11): 113101
    and may be found at https://doi.org/10.1063/5.0252812.'
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Applied Physics Letters
  issn: '00036951'
  volume: '126'
  issue: '11'
  article_number: '113101'

## Conference



## Related item



## Funding

- identifier: '12074256'
  funder_name: NSFC
- identifier: 21H05233
  funder_name: JSPS KAKENHI
- identifier: 23H02052
  funder_name: JSPS KAKENHI

## Instrument



## Instrument operator



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## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



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## Process for specimen treatment



## Computational method



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## Fileset

- id: 253185c1-1e87-4178-aceb-7aa6488bd65e
  filename: 2025A00469G_Thickness+dependent+TIBB+_250224 clean.docx
  content_type: application/vnd.openxmlformats-officedocument.wordprocessingml.document
  size: 581008
  md5: d15b5f19cdbff0c4449f664d71974f3a

## Thumbnail

fileset_id: 253185c1-1e87-4178-aceb-7aa6488bd65e
filename: 2025A00469G_Thickness+dependent+TIBB+_250224 clean.docx