@article{nakamura,
  title = {Characterization of Interface States in CVD Monolayer MoS                    <sub>2</sub>                    /Al                    <sub>2</sub>                    O                    <sub>3</sub>                    MOS Capacitors via the Conductance Method},
  author = {Shiho Nakamura, Zaoyang Lin, Daiki Tsuruoka, Takahiko Endo, Xiao Yu, Tsung-En Lee, Yasumitsu Miyata, Nobuyuki Aoki, Mengnan Ke},
  publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
  year = {2026},
  keywords = {MoS2 MOS Capacitors}
}